{"title":"来自正式规格的自动测试","authors":"M. Satpathy, M. Butler, M. Leuschel, S. Ramesh","doi":"10.1007/978-3-540-73770-4_6","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":239959,"journal":{"name":"On Tap","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-02-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"30","resultStr":"{\"title\":\"Automatic Testing from Formal Specifications\",\"authors\":\"M. Satpathy, M. Butler, M. Leuschel, S. Ramesh\",\"doi\":\"10.1007/978-3-540-73770-4_6\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":239959,\"journal\":{\"name\":\"On Tap\",\"volume\":\"8 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-02-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"30\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"On Tap\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1007/978-3-540-73770-4_6\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"On Tap","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-3-540-73770-4_6","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}