S. Fujii, M. Ogihara, M. Shimizu, M. Yoshida, K. Numata, T. Hara, S. Watanabe, S. Sawada, T. Mizuno, J. Kumagai, S. Yoshikawa, S. Kaki, Y. Saito, H. Aochi, T. Hamamoto, K. Toita
{"title":"45 ns 16mb三孔结构DRAM","authors":"S. Fujii, M. Ogihara, M. Shimizu, M. Yoshida, K. Numata, T. Hara, S. Watanabe, S. Sawada, T. Mizuno, J. Kumagai, S. Yoshikawa, S. Kaki, Y. Saito, H. Aochi, T. Hamamoto, K. Toita","doi":"10.1109/ISSCC.1989.48276","DOIUrl":null,"url":null,"abstract":"The authors describe a 16-Mb DRAM (dynamic RAM) fabricated with a triple-well CMOS technology that enables optimum choice of well bias. With this technology, an optimized chip architecture, and a p-channel load word-line bootstrap driver incorporating a predecoder a 45-ns row-access-strobe access time is achieved. The memory cell is in a quarter-pitched arrangement combined with an interdigitated bit-line/shared-sense-amplifier scheme. This overcomes the difficulty of defining capacitor-plate poly in a scaled-down trench or buried-stacked-capacitor cell. The output waveform of the RAM is shown. The features of the 16M DRAM are summarized. It is capable of fast page, static column, or nibble operation and -*1- or *4-bit organization, determined by the choice of bonding configuration.<<ETX>>","PeriodicalId":385838,"journal":{"name":"IEEE International Solid-State Circuits Conference, 1989 ISSCC. Digest of Technical Papers","volume":"121 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-02-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"52","resultStr":"{\"title\":\"A 45 ns 16 Mb DRAM with triple-well structure\",\"authors\":\"S. Fujii, M. Ogihara, M. Shimizu, M. Yoshida, K. Numata, T. Hara, S. Watanabe, S. Sawada, T. Mizuno, J. Kumagai, S. Yoshikawa, S. Kaki, Y. Saito, H. Aochi, T. Hamamoto, K. Toita\",\"doi\":\"10.1109/ISSCC.1989.48276\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The authors describe a 16-Mb DRAM (dynamic RAM) fabricated with a triple-well CMOS technology that enables optimum choice of well bias. With this technology, an optimized chip architecture, and a p-channel load word-line bootstrap driver incorporating a predecoder a 45-ns row-access-strobe access time is achieved. The memory cell is in a quarter-pitched arrangement combined with an interdigitated bit-line/shared-sense-amplifier scheme. This overcomes the difficulty of defining capacitor-plate poly in a scaled-down trench or buried-stacked-capacitor cell. The output waveform of the RAM is shown. The features of the 16M DRAM are summarized. It is capable of fast page, static column, or nibble operation and -*1- or *4-bit organization, determined by the choice of bonding configuration.<<ETX>>\",\"PeriodicalId\":385838,\"journal\":{\"name\":\"IEEE International Solid-State Circuits Conference, 1989 ISSCC. Digest of Technical Papers\",\"volume\":\"121 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-02-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"52\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE International Solid-State Circuits Conference, 1989 ISSCC. Digest of Technical Papers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSCC.1989.48276\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE International Solid-State Circuits Conference, 1989 ISSCC. Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.1989.48276","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The authors describe a 16-Mb DRAM (dynamic RAM) fabricated with a triple-well CMOS technology that enables optimum choice of well bias. With this technology, an optimized chip architecture, and a p-channel load word-line bootstrap driver incorporating a predecoder a 45-ns row-access-strobe access time is achieved. The memory cell is in a quarter-pitched arrangement combined with an interdigitated bit-line/shared-sense-amplifier scheme. This overcomes the difficulty of defining capacitor-plate poly in a scaled-down trench or buried-stacked-capacitor cell. The output waveform of the RAM is shown. The features of the 16M DRAM are summarized. It is capable of fast page, static column, or nibble operation and -*1- or *4-bit organization, determined by the choice of bonding configuration.<>