优化HfO2、Al2O3和SiO2的沉积工艺,制备出先进的低消光紫外光学涂层

G. Abromavičius, R. Buzelis, R. Drazdys, D. Perednis, A. Skrebutėnas
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引用次数: 3

摘要

在200 ~ 300 nm波段,光学涂层的性能与其光学损耗密切相关。影响镀膜消光的主要因素有:镀膜真空、电子束枪细丝的污染、离子源以及所选择的镀膜材料的光学性能。在这项工作中,调查和评估了这些不同因素的贡献。HfO2, Al2O3和SiO2是生产200nm以下紫外光学涂层最广泛使用的材料。评价了背景氧压对HfO2和Al2O3沉积过程的影响,从而降低了沉积的UV光学涂层的消光。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Optimization of HfO2, Al2O3 and SiO2 deposition leading to advanced UV optical coatings with low extinction
The performance of optical coatings for UV region (200-300 nm) is closely related to their optical losses. There are a few factors which significantly influence the extinction of deposited coating - deposition vacuum, contamination from filaments of e-beam guns, ion source and finally, the optical properties of selected deposition materials. In this work the contribution of these different factors was investigated and evaluated. HfO2, Al2O3 and SiO2 are the most widely used materials for producing UV optical coatings down to 200 nm. Influence of background oxygen pressure during HfO2 and Al2O3 deposition was evaluated which enabled to reduce extinction of the deposited UV optical coatings.
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