{"title":"硅高频系统中集成无源元件的建模与表征","authors":"R. Caverly, T. Walsh, J. Reifsnyder, S. Pearson","doi":"10.1109/SMIC.2004.1398206","DOIUrl":null,"url":null,"abstract":"A methodology for robust integrated circuit passive element modeling has been developed. The methodology was used to design process-independent structures in a silicon CMOS process and combined a number of techniques and software packages to ensure run-to-run stability of element values. Experimental data verifying the techniques is presented.","PeriodicalId":288561,"journal":{"name":"Digest of Papers. 2004 Topical Meeting onSilicon Monolithic Integrated Circuits in RF Systems, 2004.","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-09-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Modeling and characterization of integrated passive elements for applications in silicon high frequency systems\",\"authors\":\"R. Caverly, T. Walsh, J. Reifsnyder, S. Pearson\",\"doi\":\"10.1109/SMIC.2004.1398206\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A methodology for robust integrated circuit passive element modeling has been developed. The methodology was used to design process-independent structures in a silicon CMOS process and combined a number of techniques and software packages to ensure run-to-run stability of element values. Experimental data verifying the techniques is presented.\",\"PeriodicalId\":288561,\"journal\":{\"name\":\"Digest of Papers. 2004 Topical Meeting onSilicon Monolithic Integrated Circuits in RF Systems, 2004.\",\"volume\":\"23 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-09-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Digest of Papers. 2004 Topical Meeting onSilicon Monolithic Integrated Circuits in RF Systems, 2004.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SMIC.2004.1398206\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of Papers. 2004 Topical Meeting onSilicon Monolithic Integrated Circuits in RF Systems, 2004.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMIC.2004.1398206","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Modeling and characterization of integrated passive elements for applications in silicon high frequency systems
A methodology for robust integrated circuit passive element modeling has been developed. The methodology was used to design process-independent structures in a silicon CMOS process and combined a number of techniques and software packages to ensure run-to-run stability of element values. Experimental data verifying the techniques is presented.