半导体激光器(795 nm)的多频激光抽运Rb频率标准

2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) Pub Date : 2014-10-01 DOI:10.1109/APEIE.2014.7040718

A. Isakova, A. K. Dmitriev, K. A. Bikmuhametov, V. L. Velichansky, V. Vasiliev, S. Zibrov

{"title":"半导体激光器(795 nm)的多频激光抽运Rb频率标准","authors":"A. Isakova, A. K. Dmitriev, K. A. Bikmuhametov, V. L. Velichansky, V. Vasiliev, S. Zibrov","doi":"10.1109/APEIE.2014.7040718","DOIUrl":null,"url":null,"abstract":"The purpose of this research is to analyze in detail some characteristics of diode laser for further using for pumping Rb frequency standard.","PeriodicalId":202524,"journal":{"name":"2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Multi-frequency lasing of diode laser (795 nm) for pumping Rb frequency standard\",\"authors\":\"A. Isakova, A. K. Dmitriev, K. A. Bikmuhametov, V. L. Velichansky, V. Vasiliev, S. Zibrov\",\"doi\":\"10.1109/APEIE.2014.7040718\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The purpose of this research is to analyze in detail some characteristics of diode laser for further using for pumping Rb frequency standard.\",\"PeriodicalId\":202524,\"journal\":{\"name\":\"2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE)\",\"volume\":\"3 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/APEIE.2014.7040718\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APEIE.2014.7040718","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}