David Nunez, M. Poizat, J. Jimenez, E. Muñoz, M. Domínguez
{"title":"增强的低剂量率敏感性分析","authors":"David Nunez, M. Poizat, J. Jimenez, E. Muñoz, M. Domínguez","doi":"10.1109/REDW.2014.7004568","DOIUrl":null,"url":null,"abstract":"During a series of experiments, different components manufactured on bipolar technology have been irradiated at two different dose rates (36 rd(Si)/h and 360rd(Si)/h) and on two biasing conditions (ON/OFF). With the aim of identifying different factors of degradation, a set of different functions included on almost every space system has been considered. Different manufacturers and technologies have also been selected to ensure the widest possible set of data. The results obtained are not showing a significant dose rate dependency on some items although it has been detected that for several bipolar part types the worst test conditions is systematically considered under 36rd(Si)/h dose rate.","PeriodicalId":223557,"journal":{"name":"2014 IEEE Radiation Effects Data Workshop (REDW)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-07-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Enhanced Low Dose Rate Sensitivity Analysis\",\"authors\":\"David Nunez, M. Poizat, J. Jimenez, E. Muñoz, M. Domínguez\",\"doi\":\"10.1109/REDW.2014.7004568\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"During a series of experiments, different components manufactured on bipolar technology have been irradiated at two different dose rates (36 rd(Si)/h and 360rd(Si)/h) and on two biasing conditions (ON/OFF). With the aim of identifying different factors of degradation, a set of different functions included on almost every space system has been considered. Different manufacturers and technologies have also been selected to ensure the widest possible set of data. The results obtained are not showing a significant dose rate dependency on some items although it has been detected that for several bipolar part types the worst test conditions is systematically considered under 36rd(Si)/h dose rate.\",\"PeriodicalId\":223557,\"journal\":{\"name\":\"2014 IEEE Radiation Effects Data Workshop (REDW)\",\"volume\":\"22 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-07-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 IEEE Radiation Effects Data Workshop (REDW)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/REDW.2014.7004568\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 IEEE Radiation Effects Data Workshop (REDW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/REDW.2014.7004568","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
During a series of experiments, different components manufactured on bipolar technology have been irradiated at two different dose rates (36 rd(Si)/h and 360rd(Si)/h) and on two biasing conditions (ON/OFF). With the aim of identifying different factors of degradation, a set of different functions included on almost every space system has been considered. Different manufacturers and technologies have also been selected to ensure the widest possible set of data. The results obtained are not showing a significant dose rate dependency on some items although it has been detected that for several bipolar part types the worst test conditions is systematically considered under 36rd(Si)/h dose rate.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
