混响室增强后向散射:高频效应

L. A. Bronckers, A. Roc’h, A. B. Smolders
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引用次数: 9

摘要

对大尺寸器件在高频下精确测量效率的需求不断增加。在这项工作中,研究了在电极大(高达250λ)混响室中执行天线效率测量的潜力,并与其在较低频率下的使用进行了比较。结果表明,在高频处,后向散射常数的增强值存在较大的偏差。通过引入位置相关的增强后向散射常数计算,进一步研究表明,偏差主要发生在指向搅拌器的喇叭天线处。这种情况可能会因使用移动壁式搅拌器而加重。工作的结论是证明这些偏差对天线效率的潜在影响。这些偏差清楚地表明,需要对这些影响进行更多的研究。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Reverberation Chamber Enhanced Backscattering: High-Frequency Effects
The need for accurate efficiency measurements at high frequencies of large form-factor devices is ever increasing. In this work, the potential of performing antenna efficiency measurements in an electrically extremely large (up to 250λ) reverberation chamber is investigated and compared to its use at lower frequencies. It is found that there are large deviations in the enhanced backscattering constant at high frequencies. Closer investigation, by introducing a position-dependent enhanced backscattering constant calculation, shows that the deviation mostly occurs at the horn antenna directed at the stirrer. This could be aggravated by the use of a moving wall type of stirrer. The work concludes by demonstrating the potential impact of these deviations on the antenna efficiency. The deviations clearly show the need for more research into these effects.
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