{"title":"基于紧凑测试向量的二阶滤波器故障检测方法","authors":"J. Calvano, V. Alves, M. Lubaszewski","doi":"10.1109/MMICA.1999.833585","DOIUrl":null,"url":null,"abstract":"This work proposes a functional approach for fault modeling in 2/sup nd/ order filters and presents a new use for the transient analysis method for fault detection. The approach considers the filter as a 2/sup nd/ order dynamic system and the use of the peak time and the system overshoot as observed parameters. The input stimuli are compact test vectors which consist of a step, ramp or parabola. The obtained results show that 100% of soft faults can be detected.","PeriodicalId":221297,"journal":{"name":"Proceedings of the Third International Workshop on Design of Mixed-Mode Integrated Circuits and Applications (Cat. No.99EX303)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-07-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"17","resultStr":"{\"title\":\"Fault detection methodology for second order filters using compact test vectors transient analysis\",\"authors\":\"J. Calvano, V. Alves, M. Lubaszewski\",\"doi\":\"10.1109/MMICA.1999.833585\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This work proposes a functional approach for fault modeling in 2/sup nd/ order filters and presents a new use for the transient analysis method for fault detection. The approach considers the filter as a 2/sup nd/ order dynamic system and the use of the peak time and the system overshoot as observed parameters. The input stimuli are compact test vectors which consist of a step, ramp or parabola. The obtained results show that 100% of soft faults can be detected.\",\"PeriodicalId\":221297,\"journal\":{\"name\":\"Proceedings of the Third International Workshop on Design of Mixed-Mode Integrated Circuits and Applications (Cat. No.99EX303)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-07-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"17\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the Third International Workshop on Design of Mixed-Mode Integrated Circuits and Applications (Cat. No.99EX303)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MMICA.1999.833585\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the Third International Workshop on Design of Mixed-Mode Integrated Circuits and Applications (Cat. No.99EX303)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MMICA.1999.833585","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Fault detection methodology for second order filters using compact test vectors transient analysis
This work proposes a functional approach for fault modeling in 2/sup nd/ order filters and presents a new use for the transient analysis method for fault detection. The approach considers the filter as a 2/sup nd/ order dynamic system and the use of the peak time and the system overshoot as observed parameters. The input stimuli are compact test vectors which consist of a step, ramp or parabola. The obtained results show that 100% of soft faults can be detected.