基于延迟签名的fpga硬件木马检测技术

G. Sumathi, L. Srivani, D. Thirugnana Murthy, N. Murali, S. S. Satya Murty, T. Jayakumar
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引用次数: 2

摘要

在核电站、航天、军事等应用中,安全关键系统发挥着重要作用,安全性是关键设计参数之一。与软件木马(病毒)类似,硬件木马(HT)近年来引起了人们对安全问题的关注。HTs是对现有电路元件的恶意添加或修改,这些元件要么一直打开,要么只在某些条件下触发,以禁用功能,降低可靠性,并从集成芯片泄露有价值的信息。在本文中,我们考虑了在现场工作条件下插入现场可编程门阵列(FPGA)器件的高温传感器场景,并提出了一种基于延迟签名的高温传感器检测技术。通过静态时序分析,将原始网表的时延特征与从现场配置位文件中提取的网表的时延特征进行对比。由于电子设计自动化工具的结果是重复的,我们比较了延迟签名,任何偏差都表明原始设计的配置位文件/网表文件被改变了。为了提高检测效率,我们在各种工艺角进行静态时序分析,例如慢角,典型角和快速角(在不同的电压和温度组合下),这使我们能够测量最佳和最差的电路延迟值。利用这一特性,我们针对Xilinx设备上的标准基准电路,使用Xilinx ISE工具进行了模拟。实验结果反映了配置位文件在现场被篡改后延迟签名的差异。有HT电路和没有HT电路的延迟差从慢角到快角增强,从而提高了HT检测效率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
DSDPC: Delay signatures at different process corners based hardware trojan detection technique for FPGAs
In applications such as nuclear power plant, space and military, safety critical systems play an important role, where security is one of the crucial design parameters. Similar to software Trojans (virus), Hardware Trojans (HT) are raising security concerns in recent years. HTs are malicious additions or modifications to existing circuit elements which are implemented either as always on or triggered only under certain conditions, to disable functionality, reduce reliability and leak valuable information from the integrated chip. In this paper, we consider the scenario of HTs inserted in field programmable gate array (FPGA) devices during field operating conditions and propose a delay signature based HT detection technique. Static timing analysis is performed to measure the delay signatures of original netlist with that of netlist extracted from field configuration bit file. Since the results of electronic design automation tools are repetitive, we compare both the delay signatures and any deviation will indicate that configuration bit file/ netlist file of the original design is altered. To increase the detection efficiency, we perform static timing analysis at various process corners such as slow, typical and fast corners (at different voltage and temperature combinations) which allows us to measure the best and worst circuit delay values. Using this property, we performed simulations with Xilinx ISE tool by targeting standard benchmark circuits on Xilinx device. Experimental results reflected the difference in delay signatures if configuration bit file is tampered with in the field. The delay difference between with and without HT circuit is enhanced from slow to fast process corner, which in turn increased the HT detection efficiency.
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