超高密度14nm晶体管级单片3D集成电路设计

Jiajun Shi, D. Nayak, M. Ichihashi, S. Banna, C. A. Moritz
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引用次数: 20

摘要

传统的2D CMOS在22nm以下节点面临严峻挑战。单片3D (M3D)集成电路技术实现了超高密度的垂直连接,为技术节点扩展提供了良好的途径。晶体管级(TR-L)单片3D集成电路是最先进和细粒度的M3D集成电路技术。本文首次探讨了基于TR-L M3D集成电路技术的硅验证14nm Finfet工艺设计套件(PDK)的详细设计以及优点和挑战。TR-L M3D标准单元布局是基于14nm Finfet设计规则和特征尺寸实现的。半定制的RC提取方法进行了精确的3D细胞RC提取。经过广泛的仿真,评估了TR-L M3D单元功率、延迟和面积,并与相同技术节点的等效二维单元进行了比较。多个电路的系统级基准测试显示,与2D CMOS相比,TR-L M3D的占地面积减少了55%,线长缩短了25%,功耗降低了18%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
On the Design of Ultra-High Density 14nm Finfet Based Transistor-Level Monolithic 3D ICs
Conventional 2D CMOS faces severe challenges sub-22nm nodes. The monolithic 3D (M3D) IC technology enables ultra-high density vertical connections and provides a good path for technology node scaling. Transistor-level (TR-L) monolithic 3D IC is the most advanced and fine-grained M3D IC technology. In this paper, for the first time, the detailed design as well as benefits and challenges of a silicon validated 14nm Finfet process design kit (PDK) based TR-L M3D IC technology is explored. TR-L M3D standard cell layout is achieved based on 14nm Finfet design rules and feature sizes. A semi-customized RC extraction methodology is performed for accurate 3D cell RC extraction. After extensive simulation, TR-L M3D cell power, delay and area are evaluated and compared with equivalent 2D cells in the same technology node. System-level benchmarking with several circuits show up to 55% reduced footprint, 25% shorter wire length, and 18% lower power with TR-L M3D vs. 2D CMOS.
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