处理器硬错误可靠性的最优微架构设计配置选择

Ying Zhang, Lide Duan, Bin Li, Lu Peng
{"title":"处理器硬错误可靠性的最优微架构设计配置选择","authors":"Ying Zhang, Lide Duan, Bin Li, Lu Peng","doi":"10.1109/ISQED.2012.6187479","DOIUrl":null,"url":null,"abstract":"Traditional design space exploration mainly focuses on performance and power consumption. However, as one of the first-class constraints for modern processor design, the relationship between hard-error reliability and processor configurations has not been well studied. In this paper, we investigate this relationship by exploring a large processor design space. We employ a rule search strategy, i.e. Patient Rule Induction Method, to generate a set of rules which choose optimal configurations for processor hard-error reliability and its tradeoff with performance and power consumption.","PeriodicalId":205874,"journal":{"name":"Thirteenth International Symposium on Quality Electronic Design (ISQED)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-03-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Optimal microarchitectural design configuration selection for processor hard-error reliability\",\"authors\":\"Ying Zhang, Lide Duan, Bin Li, Lu Peng\",\"doi\":\"10.1109/ISQED.2012.6187479\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Traditional design space exploration mainly focuses on performance and power consumption. However, as one of the first-class constraints for modern processor design, the relationship between hard-error reliability and processor configurations has not been well studied. In this paper, we investigate this relationship by exploring a large processor design space. We employ a rule search strategy, i.e. Patient Rule Induction Method, to generate a set of rules which choose optimal configurations for processor hard-error reliability and its tradeoff with performance and power consumption.\",\"PeriodicalId\":205874,\"journal\":{\"name\":\"Thirteenth International Symposium on Quality Electronic Design (ISQED)\",\"volume\":\"3 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-03-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Thirteenth International Symposium on Quality Electronic Design (ISQED)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISQED.2012.6187479\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Thirteenth International Symposium on Quality Electronic Design (ISQED)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISQED.2012.6187479","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

摘要

传统的设计空间探索主要集中在性能和功耗上。然而,作为现代处理器设计的首要约束之一,硬错误可靠性与处理器配置之间的关系还没有得到很好的研究。在本文中,我们通过探索一个大的处理器设计空间来研究这种关系。我们采用规则搜索策略,即耐心规则归纳法,生成一组规则,以选择处理器硬错误可靠性的最佳配置及其与性能和功耗的权衡。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Optimal microarchitectural design configuration selection for processor hard-error reliability
Traditional design space exploration mainly focuses on performance and power consumption. However, as one of the first-class constraints for modern processor design, the relationship between hard-error reliability and processor configurations has not been well studied. In this paper, we investigate this relationship by exploring a large processor design space. We employ a rule search strategy, i.e. Patient Rule Induction Method, to generate a set of rules which choose optimal configurations for processor hard-error reliability and its tradeoff with performance and power consumption.
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