{"title":"PLA的断裂故障模型及故障崩塌分析","authors":"Gwo-Haur Hwang, W. Shen","doi":"10.1109/ATS.1992.224412","DOIUrl":null,"url":null,"abstract":"The behavior of break faults in PLAs is analyzed and a fault collapsing technique for the faults is presented. From the behavioral analysis, two patterns are needed to detect a break fault. By the fault collapsing technique, the number of break faults is reduced from 2*( Hash device)+( Hash output) to less than 2*( Hash input+ Hash product)+( Hash output). Experimental results show that, for 56 benchmarks, the number of break faults after fault collapsing is reduced to 18.37%.<<ETX>>","PeriodicalId":208029,"journal":{"name":"Proceedings First Asian Test Symposium (ATS `92)","volume":"105 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-11-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Break fault model and fault collapsing analysis for PLA's\",\"authors\":\"Gwo-Haur Hwang, W. Shen\",\"doi\":\"10.1109/ATS.1992.224412\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The behavior of break faults in PLAs is analyzed and a fault collapsing technique for the faults is presented. From the behavioral analysis, two patterns are needed to detect a break fault. By the fault collapsing technique, the number of break faults is reduced from 2*( Hash device)+( Hash output) to less than 2*( Hash input+ Hash product)+( Hash output). Experimental results show that, for 56 benchmarks, the number of break faults after fault collapsing is reduced to 18.37%.<<ETX>>\",\"PeriodicalId\":208029,\"journal\":{\"name\":\"Proceedings First Asian Test Symposium (ATS `92)\",\"volume\":\"105 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-11-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings First Asian Test Symposium (ATS `92)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.1992.224412\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings First Asian Test Symposium (ATS `92)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.1992.224412","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Break fault model and fault collapsing analysis for PLA's
The behavior of break faults in PLAs is analyzed and a fault collapsing technique for the faults is presented. From the behavioral analysis, two patterns are needed to detect a break fault. By the fault collapsing technique, the number of break faults is reduced from 2*( Hash device)+( Hash output) to less than 2*( Hash input+ Hash product)+( Hash output). Experimental results show that, for 56 benchmarks, the number of break faults after fault collapsing is reduced to 18.37%.<>