新颖、高密度的R/C终端网络

L. Schaper, R. Ulrich, C. Gross, P. Parkerson
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引用次数: 0

摘要

集成的100pf /50 /spl ω / R/C终端与0402足迹设计,制造和评估在硅和玻璃基板。这些结构由复合阳极氧化的钽电容器和一个钽金属电阻组成,只需要两个掩模步骤,两个金属层,没有过孔,通过湿蚀刻进行图案。由于可以通过改变阳极氧化电压和通过改变Ta厚度来改变电阻,因此可以在不改变端子尺寸或制作新掩模的情况下调整元件值。每个终端都显示了接近期望值的经典R/C行为。在两个5英寸晶圆上制造的600个端子中,只有两个因电容器短路而缺陷,没有一个因电阻故障而缺陷。进一步缩小规模是可能的;这些器件可以集成为8、32或64宽阵列,用于总线终端。设备密度仅受csp类附件的合理I/O间距的限制。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Novel, high density R/C terminating networks
Integrated 100 pF/50 /spl Omega/ R/C terminators with an 0402 footprint were designed, fabricated and evaluated on Si and glass substrates. These structures consisted of compound anodized Ta capacitors and a Ta metal resistor, and required only two mask steps, two metal layers, no vias, and patterning by wet etching. The component values can be adjusted without having to change the size of the terminators or make new masks because the capacitance may be modified by changing the anodization voltage and the resistance by changing the Ta thickness. Each terminator showed classic R/C behavior near expected values. Of the 600 terminators fabricated on two 5 inch wafers, only two were defective due to capacitor shorts and none due to resistor faults. Further size reductions are possible; these devices could be integrated as 8, 32 or 64-wide arrays for bus termination. The device density is limited only by a reasonable I/O pitch for CSP-like attachment.
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