{"title":"桥接故障组合电路的静态电流测试","authors":"M. Roca, A. Rubio","doi":"10.1109/ATS.1992.224437","DOIUrl":null,"url":null,"abstract":"The authors present a classification of bridging faults in ISCAS combinational circuits and analyze the L/sub DDQ/ testability of this sort of faults. A procedure for test pattern generation is implemented and it is applied to these circuits. The problem of testing feedback bridging faults is also analyzed showing that this type of fault is also testable by I/sub DDQ/ even if they exhibit an oscillating behaviour. This result is verified through simulated and experimental data.<<ETX>>","PeriodicalId":208029,"journal":{"name":"Proceedings First Asian Test Symposium (ATS `92)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-11-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Quiescent current testing of combinational circuits with bridging faults\",\"authors\":\"M. Roca, A. Rubio\",\"doi\":\"10.1109/ATS.1992.224437\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The authors present a classification of bridging faults in ISCAS combinational circuits and analyze the L/sub DDQ/ testability of this sort of faults. A procedure for test pattern generation is implemented and it is applied to these circuits. The problem of testing feedback bridging faults is also analyzed showing that this type of fault is also testable by I/sub DDQ/ even if they exhibit an oscillating behaviour. This result is verified through simulated and experimental data.<<ETX>>\",\"PeriodicalId\":208029,\"journal\":{\"name\":\"Proceedings First Asian Test Symposium (ATS `92)\",\"volume\":\"22 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-11-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings First Asian Test Symposium (ATS `92)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.1992.224437\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings First Asian Test Symposium (ATS `92)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.1992.224437","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Quiescent current testing of combinational circuits with bridging faults
The authors present a classification of bridging faults in ISCAS combinational circuits and analyze the L/sub DDQ/ testability of this sort of faults. A procedure for test pattern generation is implemented and it is applied to these circuits. The problem of testing feedback bridging faults is also analyzed showing that this type of fault is also testable by I/sub DDQ/ even if they exhibit an oscillating behaviour. This result is verified through simulated and experimental data.<>
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
