{"title":"一些评估飞机系统中电爆炸装置射频敏感性的英国技术","authors":"T. J. Jenkins, N. Olohan","doi":"10.1109/ISEMC.1976.7568755","DOIUrl":null,"url":null,"abstract":"Trials are conducted at the Aeroplane and Armament Experimental Establishment, Boscombe Down, England to assess the susceptibility of military systems incor porating Electro-Explosive Devices. The paper describes some of the test facilities currently available at A&AEE and outlines some general trials requirements and problem areas. Some instrumentation techniques, developed by EMI Electronics Ltd, in direct support of A&AEE trials are described, including an improved tester for assessing susceptibility to switching transients, and improved EED sensors using hot carrier diodes and thin film thermocouples for measuring susceptibility of systems to external RF environments. Work proceeding at EMI to determine EED firing sensitivities at EF is also accounted.","PeriodicalId":296335,"journal":{"name":"IEEE 1976 International Symposium on Electromagnetic Compatibility","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1976-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Some UK Techniques for Assessing RF Susceptibility of Electro-Explosive Devices in Aircraft Systems\",\"authors\":\"T. J. Jenkins, N. Olohan\",\"doi\":\"10.1109/ISEMC.1976.7568755\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Trials are conducted at the Aeroplane and Armament Experimental Establishment, Boscombe Down, England to assess the susceptibility of military systems incor porating Electro-Explosive Devices. The paper describes some of the test facilities currently available at A&AEE and outlines some general trials requirements and problem areas. Some instrumentation techniques, developed by EMI Electronics Ltd, in direct support of A&AEE trials are described, including an improved tester for assessing susceptibility to switching transients, and improved EED sensors using hot carrier diodes and thin film thermocouples for measuring susceptibility of systems to external RF environments. Work proceeding at EMI to determine EED firing sensitivities at EF is also accounted.\",\"PeriodicalId\":296335,\"journal\":{\"name\":\"IEEE 1976 International Symposium on Electromagnetic Compatibility\",\"volume\":\"8 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1976-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE 1976 International Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.1976.7568755\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE 1976 International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1976.7568755","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Some UK Techniques for Assessing RF Susceptibility of Electro-Explosive Devices in Aircraft Systems
Trials are conducted at the Aeroplane and Armament Experimental Establishment, Boscombe Down, England to assess the susceptibility of military systems incor porating Electro-Explosive Devices. The paper describes some of the test facilities currently available at A&AEE and outlines some general trials requirements and problem areas. Some instrumentation techniques, developed by EMI Electronics Ltd, in direct support of A&AEE trials are described, including an improved tester for assessing susceptibility to switching transients, and improved EED sensors using hot carrier diodes and thin film thermocouples for measuring susceptibility of systems to external RF environments. Work proceeding at EMI to determine EED firing sensitivities at EF is also accounted.