STUDY OF THE CHROMIUM LAYER USING GDOES, OPTICAL MICROSCOPY AND EDX MICROANALYSIS ON A SCANNING ELECTRON MICROSCOPE

The article compares the methods of analysis of the surface chromium layer on two chromium-plated samples under the same technological conditions. However, both samples were visually different. The base material was analysed using GDOES analysis. The carbon and sulphur contents were refined by elemental analysis. The surface layers were evaluated by optical microscopy, glow discharge optical emission spectrometry (GDOES) and EDX microanalysis on a scanning electron microscope. The microhardness of the chromium layer was also measured. There was about a 10% difference in the thickness of the chromium layer and a 5% difference in its hardness. A more significant proportion of transverse cracks occurred in the layer of one sample. It can lead to more wear and corrosion of the product.