{"title":"局部放电用微传感器","authors":"H. Tomas, P. Michal","doi":"10.1109/ENICS.2008.17","DOIUrl":null,"url":null,"abstract":"For longer service life and better reliability of high voltage under stressed parts or of such whole systems, facilities for deep investigation are necessary. Extremely small microsensors which can be integrated during the production inside measured object like high voltage transformers, drivers or high voltage parts of PCB's are, can serve us valued information about discharge activity during whole service life.","PeriodicalId":162793,"journal":{"name":"2008 International Conference on Advances in Electronics and Micro-electronics","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-09-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Microsensors for Partial Discharge\",\"authors\":\"H. Tomas, P. Michal\",\"doi\":\"10.1109/ENICS.2008.17\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"For longer service life and better reliability of high voltage under stressed parts or of such whole systems, facilities for deep investigation are necessary. Extremely small microsensors which can be integrated during the production inside measured object like high voltage transformers, drivers or high voltage parts of PCB's are, can serve us valued information about discharge activity during whole service life.\",\"PeriodicalId\":162793,\"journal\":{\"name\":\"2008 International Conference on Advances in Electronics and Micro-electronics\",\"volume\":\"40 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-09-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 International Conference on Advances in Electronics and Micro-electronics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ENICS.2008.17\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 International Conference on Advances in Electronics and Micro-electronics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ENICS.2008.17","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
For longer service life and better reliability of high voltage under stressed parts or of such whole systems, facilities for deep investigation are necessary. Extremely small microsensors which can be integrated during the production inside measured object like high voltage transformers, drivers or high voltage parts of PCB's are, can serve us valued information about discharge activity during whole service life.
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