R. Cao, J. Ferguson, Y. Drissi, F. Gays, A. Arriordaz, I. O’Connor
{"title":"DRC对非曼哈顿布局设计的挑战和解决方案","authors":"R. Cao, J. Ferguson, Y. Drissi, F. Gays, A. Arriordaz, I. O’Connor","doi":"10.1109/OMN.2014.6924580","DOIUrl":null,"url":null,"abstract":"As photonic circuit designs allow and require a wide variety of geometrical shapes that do not exist in traditional integrated circuit (IC) designs, established design rule checking (DRC) methods are severely inadequate and are increasingly unable to fulfill the requirements for reliable and consistent geometrical verification of such layouts. This study presents the application of equation-based DRC, an extended DRC technique that addresses the DRC challenges brought by the non-Manhattan geometries that are widely present in photonic layouts.","PeriodicalId":161791,"journal":{"name":"2014 International Conference on Optical MEMS and Nanophotonics","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"DRC challenges and solutions for non-Manhattan layout designs\",\"authors\":\"R. Cao, J. Ferguson, Y. Drissi, F. Gays, A. Arriordaz, I. O’Connor\",\"doi\":\"10.1109/OMN.2014.6924580\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"As photonic circuit designs allow and require a wide variety of geometrical shapes that do not exist in traditional integrated circuit (IC) designs, established design rule checking (DRC) methods are severely inadequate and are increasingly unable to fulfill the requirements for reliable and consistent geometrical verification of such layouts. This study presents the application of equation-based DRC, an extended DRC technique that addresses the DRC challenges brought by the non-Manhattan geometries that are widely present in photonic layouts.\",\"PeriodicalId\":161791,\"journal\":{\"name\":\"2014 International Conference on Optical MEMS and Nanophotonics\",\"volume\":\"8 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-10-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 International Conference on Optical MEMS and Nanophotonics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/OMN.2014.6924580\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 International Conference on Optical MEMS and Nanophotonics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/OMN.2014.6924580","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
DRC challenges and solutions for non-Manhattan layout designs
As photonic circuit designs allow and require a wide variety of geometrical shapes that do not exist in traditional integrated circuit (IC) designs, established design rule checking (DRC) methods are severely inadequate and are increasingly unable to fulfill the requirements for reliable and consistent geometrical verification of such layouts. This study presents the application of equation-based DRC, an extended DRC technique that addresses the DRC challenges brought by the non-Manhattan geometries that are widely present in photonic layouts.