高功率mqw - dfb - dc - pbh - ld在相干光通信系统中的可靠性研究

13th IEEE International Semiconductor Laser Conference Pub Date : 1992-09-21 DOI:10.1109/ISLC.1992.763662

M. Kitamura, H. Yamazaki, Hirohito Yamada, S. Takano, K. Kosuge, M. Yamaguchi, I. Mito

{"title":"高功率mqw - dfb - dc - pbh - ld在相干光通信系统中的可靠性研究","authors":"M. Kitamura, H. Yamazaki, Hirohito Yamada, S. Takano, K. Kosuge, M. Yamaguchi, I. Mito","doi":"10.1109/ISLC.1992.763662","DOIUrl":null,"url":null,"abstract":"Result of aging test for 1.55/spl mu/m MQW-DFB-DC-PBH-LDs, in terms of spectral linewidth, FM characteristics and lasing wavelength, is reported. Over 10/sup 5/ hours reliability was estimated from long term aging and accelerated aging tests.","PeriodicalId":207712,"journal":{"name":"13th IEEE International Semiconductor Laser Conference","volume":"50 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Reliability of high power MQW-DFB-DC-PBH-LDs for Coherent Optical Communication System Application\",\"authors\":\"M. Kitamura, H. Yamazaki, Hirohito Yamada, S. Takano, K. Kosuge, M. Yamaguchi, I. Mito\",\"doi\":\"10.1109/ISLC.1992.763662\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Result of aging test for 1.55/spl mu/m MQW-DFB-DC-PBH-LDs, in terms of spectral linewidth, FM characteristics and lasing wavelength, is reported. Over 10/sup 5/ hours reliability was estimated from long term aging and accelerated aging tests.\",\"PeriodicalId\":207712,\"journal\":{\"name\":\"13th IEEE International Semiconductor Laser Conference\",\"volume\":\"50 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-09-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"13th IEEE International Semiconductor Laser Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISLC.1992.763662\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"13th IEEE International Semiconductor Laser Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISLC.1992.763662","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

报道了1.55/spl mu/m mqw - dfb - dc - pbh - ld的谱线宽度、调频特性和激光波长老化试验结果。从长期老化和加速老化试验中估计可靠性超过10/sup 5/小时。

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Reliability of high power MQW-DFB-DC-PBH-LDs for Coherent Optical Communication System Application

Result of aging test for 1.55/spl mu/m MQW-DFB-DC-PBH-LDs, in terms of spectral linewidth, FM characteristics and lasing wavelength, is reported. Over 10/sup 5/ hours reliability was estimated from long term aging and accelerated aging tests.

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13th IEEE International Semiconductor Laser Conference

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