{"title":"以太网局域网商用设备单事件效应质子和重离子测试结果","authors":"C. Poivey, P. Garnier, T. Carrière, J. Nagel","doi":"10.1109/REDW.1996.574192","DOIUrl":null,"url":null,"abstract":"We present proton and heavy ion single event effect (SEE) ground test results for candidate spacecraft commercial electronics. Device types are IEEE802.3 (ETHERNET) Local Area Network (LAN) controllers, repeaters and transceivers.","PeriodicalId":196196,"journal":{"name":"1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-07-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Single event effect proton and heavy ions test results for Ethernet local area network commercial devices\",\"authors\":\"C. Poivey, P. Garnier, T. Carrière, J. Nagel\",\"doi\":\"10.1109/REDW.1996.574192\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We present proton and heavy ion single event effect (SEE) ground test results for candidate spacecraft commercial electronics. Device types are IEEE802.3 (ETHERNET) Local Area Network (LAN) controllers, repeaters and transceivers.\",\"PeriodicalId\":196196,\"journal\":{\"name\":\"1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference\",\"volume\":\"20 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-07-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/REDW.1996.574192\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/REDW.1996.574192","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Single event effect proton and heavy ions test results for Ethernet local area network commercial devices
We present proton and heavy ion single event effect (SEE) ground test results for candidate spacecraft commercial electronics. Device types are IEEE802.3 (ETHERNET) Local Area Network (LAN) controllers, repeaters and transceivers.