一种测量刻度刻度线间距的新方法

W. B. Penzes, R. Allen, M. Cresswell, L. W. Linholm, E. Teague
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引用次数: 4

摘要

线秤在整个工业中用于各种应用。最常见的是台阶千分尺,这是一种用于校准光学仪器(如显微镜)的小刻度玻璃秤。然而,由于光学校准技术的时间和成本,除了关键应用之外,通常不校准级千分尺。提出了一种用电气测试结构计量法标定线尺的方法。给出了该技术的描述以及该技术的结果示例
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A new method to measure the distance between graduation lines on graduated scales
Line scales are used throughout industry for a variety of applications. The most common is the stage micrometer, a small, graduated glass scale for the calibration of optical instruments such as microscopes. However, stage micrometers are generally not calibrated, except for critical applications, due to time and cost of optical calibration techniques. A method for calibrating line scales is presented which uses electrical test structure metrology. A description of the technique as well as examples of results from this technique are presented.<>
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