{"title":"细粒度电源管理的多级上电复位","authors":"Andres Amaya, G. LuisE.Rueda, E. Roa","doi":"10.1109/PATMOS.2018.8464167","DOIUrl":null,"url":null,"abstract":"Several proposals of power-on-reset (POR) circuits have been reported in the literature, however only a few number of them offer the possibility to have configurable reset voltage levels. This paper proposes a POR circuit with programmable voltage thresholds allowing to operate in a wide number of applications. The circuit is based on a multi-level voltage reference using native transistors, which allows to have a reduced area and power consumption. The POR is designed in a $0.18 \\mu \\mathrm{m}$ standard-logic CMOS technology and occupies an area of $83\\mu$ m x $68\\mu \\mathrm{m}$. Simulations results show a robust performance regarding temperature and process variations.","PeriodicalId":234100,"journal":{"name":"2018 28th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"A Multi-Level Power-on Reset for Fine-Grained Power Management\",\"authors\":\"Andres Amaya, G. LuisE.Rueda, E. Roa\",\"doi\":\"10.1109/PATMOS.2018.8464167\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Several proposals of power-on-reset (POR) circuits have been reported in the literature, however only a few number of them offer the possibility to have configurable reset voltage levels. This paper proposes a POR circuit with programmable voltage thresholds allowing to operate in a wide number of applications. The circuit is based on a multi-level voltage reference using native transistors, which allows to have a reduced area and power consumption. The POR is designed in a $0.18 \\\\mu \\\\mathrm{m}$ standard-logic CMOS technology and occupies an area of $83\\\\mu$ m x $68\\\\mu \\\\mathrm{m}$. Simulations results show a robust performance regarding temperature and process variations.\",\"PeriodicalId\":234100,\"journal\":{\"name\":\"2018 28th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS)\",\"volume\":\"18 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 28th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/PATMOS.2018.8464167\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 28th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PATMOS.2018.8464167","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A Multi-Level Power-on Reset for Fine-Grained Power Management
Several proposals of power-on-reset (POR) circuits have been reported in the literature, however only a few number of them offer the possibility to have configurable reset voltage levels. This paper proposes a POR circuit with programmable voltage thresholds allowing to operate in a wide number of applications. The circuit is based on a multi-level voltage reference using native transistors, which allows to have a reduced area and power consumption. The POR is designed in a $0.18 \mu \mathrm{m}$ standard-logic CMOS technology and occupies an area of $83\mu$ m x $68\mu \mathrm{m}$. Simulations results show a robust performance regarding temperature and process variations.