不确定度小于1mk的NTC温度传感器的长期漂移研究

A. Kulkarni, M. Patrascu, Y. V. D. Vijver, J. V. Wensveen, R. Pijnenburg, S. Nihtianov
{"title":"不确定度小于1mk的NTC温度传感器的长期漂移研究","authors":"A. Kulkarni, M. Patrascu, Y. V. D. Vijver, J. V. Wensveen, R. Pijnenburg, S. Nihtianov","doi":"10.1109/ISIE.2015.7281460","DOIUrl":null,"url":null,"abstract":"Long-term drift of temperature sensors is critical to applications requiring high reliability. However, documentation and knowledge regarding long-term stability is limited. Usually manufacturers promulgate drift margins down to 10-20 mK/year, while the performance of the sensors might be much better. For some advanced industrial applications, which demand drift rates down to a few mK/year, this information is inadequate. In this paper, we present our investigation of the long-term drift of a few sets of small footprint, off-the-shelf NTC (negative temperature coefficient) temperature sensors, based on an extremely stable test setup guaranteeing stability of better than 1 mK between two calibration intervals. The results show that the SMD type sensor from Murata manufacturing (NCP15XH103D03RC), intriguingly, is the most stable sensor among the sensors tested with a drift rate of 0.492 mK/year peak-to-peak. Most of the other sensors tested have drift rates of lower than 1 mK/year, making them suitable for temperature sensing applications requiring long-term stabilities in the mK range.","PeriodicalId":377110,"journal":{"name":"2015 IEEE 24th International Symposium on Industrial Electronics (ISIE)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-06-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Investigation of long-term drift of NTC temperature sensors with less than 1 mK uncertainty\",\"authors\":\"A. Kulkarni, M. Patrascu, Y. V. D. Vijver, J. V. Wensveen, R. Pijnenburg, S. Nihtianov\",\"doi\":\"10.1109/ISIE.2015.7281460\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Long-term drift of temperature sensors is critical to applications requiring high reliability. However, documentation and knowledge regarding long-term stability is limited. Usually manufacturers promulgate drift margins down to 10-20 mK/year, while the performance of the sensors might be much better. For some advanced industrial applications, which demand drift rates down to a few mK/year, this information is inadequate. In this paper, we present our investigation of the long-term drift of a few sets of small footprint, off-the-shelf NTC (negative temperature coefficient) temperature sensors, based on an extremely stable test setup guaranteeing stability of better than 1 mK between two calibration intervals. The results show that the SMD type sensor from Murata manufacturing (NCP15XH103D03RC), intriguingly, is the most stable sensor among the sensors tested with a drift rate of 0.492 mK/year peak-to-peak. Most of the other sensors tested have drift rates of lower than 1 mK/year, making them suitable for temperature sensing applications requiring long-term stabilities in the mK range.\",\"PeriodicalId\":377110,\"journal\":{\"name\":\"2015 IEEE 24th International Symposium on Industrial Electronics (ISIE)\",\"volume\":\"32 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-06-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 IEEE 24th International Symposium on Industrial Electronics (ISIE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISIE.2015.7281460\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE 24th International Symposium on Industrial Electronics (ISIE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISIE.2015.7281460","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

摘要

温度传感器的长期漂移对于需要高可靠性的应用至关重要。然而,关于长期稳定性的文档和知识是有限的。通常制造商颁布的漂移边际下降到10-20 mK/年,而传感器的性能可能会好得多。对于一些要求漂移率降至几mK/年的先进工业应用,这些信息是不充分的。在本文中,我们基于一个非常稳定的测试装置,研究了几套小尺寸、现成的NTC(负温度系数)温度传感器的长期漂移,该测试装置保证了两个校准间隔之间优于1 mK的稳定性。结果表明,村田制程的SMD型传感器(NCP15XH103D03RC)是测试传感器中最稳定的传感器,峰间漂移率为0.492 mK/年。大多数其他测试传感器的漂移率低于1 mK/年,使其适用于需要在mK范围内长期稳定的温度传感应用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Investigation of long-term drift of NTC temperature sensors with less than 1 mK uncertainty
Long-term drift of temperature sensors is critical to applications requiring high reliability. However, documentation and knowledge regarding long-term stability is limited. Usually manufacturers promulgate drift margins down to 10-20 mK/year, while the performance of the sensors might be much better. For some advanced industrial applications, which demand drift rates down to a few mK/year, this information is inadequate. In this paper, we present our investigation of the long-term drift of a few sets of small footprint, off-the-shelf NTC (negative temperature coefficient) temperature sensors, based on an extremely stable test setup guaranteeing stability of better than 1 mK between two calibration intervals. The results show that the SMD type sensor from Murata manufacturing (NCP15XH103D03RC), intriguingly, is the most stable sensor among the sensors tested with a drift rate of 0.492 mK/year peak-to-peak. Most of the other sensors tested have drift rates of lower than 1 mK/year, making them suitable for temperature sensing applications requiring long-term stabilities in the mK range.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信