A. Kulkarni, M. Patrascu, Y. V. D. Vijver, J. V. Wensveen, R. Pijnenburg, S. Nihtianov
{"title":"不确定度小于1mk的NTC温度传感器的长期漂移研究","authors":"A. Kulkarni, M. Patrascu, Y. V. D. Vijver, J. V. Wensveen, R. Pijnenburg, S. Nihtianov","doi":"10.1109/ISIE.2015.7281460","DOIUrl":null,"url":null,"abstract":"Long-term drift of temperature sensors is critical to applications requiring high reliability. However, documentation and knowledge regarding long-term stability is limited. Usually manufacturers promulgate drift margins down to 10-20 mK/year, while the performance of the sensors might be much better. For some advanced industrial applications, which demand drift rates down to a few mK/year, this information is inadequate. In this paper, we present our investigation of the long-term drift of a few sets of small footprint, off-the-shelf NTC (negative temperature coefficient) temperature sensors, based on an extremely stable test setup guaranteeing stability of better than 1 mK between two calibration intervals. The results show that the SMD type sensor from Murata manufacturing (NCP15XH103D03RC), intriguingly, is the most stable sensor among the sensors tested with a drift rate of 0.492 mK/year peak-to-peak. Most of the other sensors tested have drift rates of lower than 1 mK/year, making them suitable for temperature sensing applications requiring long-term stabilities in the mK range.","PeriodicalId":377110,"journal":{"name":"2015 IEEE 24th International Symposium on Industrial Electronics (ISIE)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-06-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Investigation of long-term drift of NTC temperature sensors with less than 1 mK uncertainty\",\"authors\":\"A. Kulkarni, M. Patrascu, Y. V. D. Vijver, J. V. Wensveen, R. Pijnenburg, S. Nihtianov\",\"doi\":\"10.1109/ISIE.2015.7281460\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Long-term drift of temperature sensors is critical to applications requiring high reliability. However, documentation and knowledge regarding long-term stability is limited. Usually manufacturers promulgate drift margins down to 10-20 mK/year, while the performance of the sensors might be much better. For some advanced industrial applications, which demand drift rates down to a few mK/year, this information is inadequate. In this paper, we present our investigation of the long-term drift of a few sets of small footprint, off-the-shelf NTC (negative temperature coefficient) temperature sensors, based on an extremely stable test setup guaranteeing stability of better than 1 mK between two calibration intervals. The results show that the SMD type sensor from Murata manufacturing (NCP15XH103D03RC), intriguingly, is the most stable sensor among the sensors tested with a drift rate of 0.492 mK/year peak-to-peak. Most of the other sensors tested have drift rates of lower than 1 mK/year, making them suitable for temperature sensing applications requiring long-term stabilities in the mK range.\",\"PeriodicalId\":377110,\"journal\":{\"name\":\"2015 IEEE 24th International Symposium on Industrial Electronics (ISIE)\",\"volume\":\"32 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-06-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 IEEE 24th International Symposium on Industrial Electronics (ISIE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISIE.2015.7281460\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE 24th International Symposium on Industrial Electronics (ISIE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISIE.2015.7281460","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Investigation of long-term drift of NTC temperature sensors with less than 1 mK uncertainty
Long-term drift of temperature sensors is critical to applications requiring high reliability. However, documentation and knowledge regarding long-term stability is limited. Usually manufacturers promulgate drift margins down to 10-20 mK/year, while the performance of the sensors might be much better. For some advanced industrial applications, which demand drift rates down to a few mK/year, this information is inadequate. In this paper, we present our investigation of the long-term drift of a few sets of small footprint, off-the-shelf NTC (negative temperature coefficient) temperature sensors, based on an extremely stable test setup guaranteeing stability of better than 1 mK between two calibration intervals. The results show that the SMD type sensor from Murata manufacturing (NCP15XH103D03RC), intriguingly, is the most stable sensor among the sensors tested with a drift rate of 0.492 mK/year peak-to-peak. Most of the other sensors tested have drift rates of lower than 1 mK/year, making them suitable for temperature sensing applications requiring long-term stabilities in the mK range.