{"title":"包含立方体的随机模式及其在合成多态完全测试中的应用","authors":"S. Pateras, J. Rajski","doi":"10.1109/TEST.1991.519709","DOIUrl":null,"url":null,"abstract":"The novel concept of cube-contained random patterns represents an alternative to weighted random pattern testing. Reductions in random pattern test lengths are achieved by the successive assignment of temporarily fixed values to selected inputs during the random pattern generation process. Experimental results show that cube-contained random patterns can achieve 100% fault coverage of synthesized ciscuits using orders of magnitude less patterns than when equiprobable random patterns are used.","PeriodicalId":272630,"journal":{"name":"1991, Proceedings. International Test Conference","volume":"57 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"26","resultStr":"{\"title\":\"Cube-Contained Random Patterns and their Application to the Complete Testing of Synthesized Multi-le\",\"authors\":\"S. Pateras, J. Rajski\",\"doi\":\"10.1109/TEST.1991.519709\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The novel concept of cube-contained random patterns represents an alternative to weighted random pattern testing. Reductions in random pattern test lengths are achieved by the successive assignment of temporarily fixed values to selected inputs during the random pattern generation process. Experimental results show that cube-contained random patterns can achieve 100% fault coverage of synthesized ciscuits using orders of magnitude less patterns than when equiprobable random patterns are used.\",\"PeriodicalId\":272630,\"journal\":{\"name\":\"1991, Proceedings. International Test Conference\",\"volume\":\"57 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-10-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"26\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1991, Proceedings. International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.1991.519709\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1991, Proceedings. International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1991.519709","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Cube-Contained Random Patterns and their Application to the Complete Testing of Synthesized Multi-le
The novel concept of cube-contained random patterns represents an alternative to weighted random pattern testing. Reductions in random pattern test lengths are achieved by the successive assignment of temporarily fixed values to selected inputs during the random pattern generation process. Experimental results show that cube-contained random patterns can achieve 100% fault coverage of synthesized ciscuits using orders of magnitude less patterns than when equiprobable random patterns are used.