时序电路证候测试设计软件包、仪器及证候测试系统

Fanglei Wang, Jijie Wang
{"title":"时序电路证候测试设计软件包、仪器及证候测试系统","authors":"Fanglei Wang, Jijie Wang","doi":"10.1109/ATS.1992.224405","DOIUrl":null,"url":null,"abstract":"Syndrome testing and Syndrome design for testability are very difficult to put into practice. The authors propose some research results which can solve these difficulties. They include computer aid Syndrome testable design, Syndrome structured design for testability and multiple Syndrome testing instrument, etc. These techniques open the way for putting Syndrome testing and Syndrome design for testability into practice.<<ETX>>","PeriodicalId":208029,"journal":{"name":"Proceedings First Asian Test Symposium (ATS `92)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-11-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Syndrome testable design software package, instrument and Syndrome testing system for sequential circuits\",\"authors\":\"Fanglei Wang, Jijie Wang\",\"doi\":\"10.1109/ATS.1992.224405\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Syndrome testing and Syndrome design for testability are very difficult to put into practice. The authors propose some research results which can solve these difficulties. They include computer aid Syndrome testable design, Syndrome structured design for testability and multiple Syndrome testing instrument, etc. These techniques open the way for putting Syndrome testing and Syndrome design for testability into practice.<<ETX>>\",\"PeriodicalId\":208029,\"journal\":{\"name\":\"Proceedings First Asian Test Symposium (ATS `92)\",\"volume\":\"32 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-11-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings First Asian Test Symposium (ATS `92)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.1992.224405\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings First Asian Test Symposium (ATS `92)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.1992.224405","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

针对可测试性的证候测试和证候设计很难付诸实践。作者提出了一些可以解决这些困难的研究成果。包括计算机辅助证候可测性设计、证候结构化可测性设计和多证候测试仪等。这些技术为实践证候测试和可测试性证候设计开辟了道路
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Syndrome testable design software package, instrument and Syndrome testing system for sequential circuits
Syndrome testing and Syndrome design for testability are very difficult to put into practice. The authors propose some research results which can solve these difficulties. They include computer aid Syndrome testable design, Syndrome structured design for testability and multiple Syndrome testing instrument, etc. These techniques open the way for putting Syndrome testing and Syndrome design for testability into practice.<>
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信