{"title":"利用数字测量技术在线测量电容式绝缘介质损耗角","authors":"X. Hang, F. Bai, Z. Yan","doi":"10.1109/ISEIM.1995.496562","DOIUrl":null,"url":null,"abstract":"A digital measurement technique for on-line measurement of the dielectric loss angle of capacitive-type insulation by means of an 8098 single chip microcontroller is presented. The principle of the method and the hardware and software design are discussed.","PeriodicalId":130178,"journal":{"name":"Proceedings of 1995 International Symposium on Electrical Insulating Materials","volume":"47 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"On-line measuring dielectric loss angle of capacitive-type insulation by using digital measurement technique\",\"authors\":\"X. Hang, F. Bai, Z. Yan\",\"doi\":\"10.1109/ISEIM.1995.496562\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A digital measurement technique for on-line measurement of the dielectric loss angle of capacitive-type insulation by means of an 8098 single chip microcontroller is presented. The principle of the method and the hardware and software design are discussed.\",\"PeriodicalId\":130178,\"journal\":{\"name\":\"Proceedings of 1995 International Symposium on Electrical Insulating Materials\",\"volume\":\"47 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-09-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of 1995 International Symposium on Electrical Insulating Materials\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEIM.1995.496562\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1995 International Symposium on Electrical Insulating Materials","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEIM.1995.496562","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
On-line measuring dielectric loss angle of capacitive-type insulation by using digital measurement technique
A digital measurement technique for on-line measurement of the dielectric loss angle of capacitive-type insulation by means of an 8098 single chip microcontroller is presented. The principle of the method and the hardware and software design are discussed.
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