一种基于28nm FDSOI CMOS的0.2-11.7GHz高精度注入锁定多相发生器,具有混合模拟/数字校准环路

G. Anzalone, E. Monaco, G. Albasini, S. Erba, A. Mazzanti
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引用次数: 5

摘要

提出了一种利用混合模拟/数字校准环路产生高精度8相时钟的注入锁定环振荡器(ILRO)。基于无源混频器的鉴相器(PD)测量正交误差并连续调谐振荡器以进行精细相位校正。同时,一个窗口比较器监视PD输出并在后台驱动数字粗校准。ILRO在宽工作频率范围和大电源和温度变化范围内保持高相位精度。该芯片采用28nm FDSOI CMOS制造,功耗为3mW至15mW,测量显示频率范围为0.2-11.7GHz,在±20%电源和-40×120°C温度变化下,相位误差优于1.5°。测试性能满足1 ~ 45gb /s四分之一速率多标准I/O接收机的要求。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A 0.2–11.7GHz, high accuracy injection-locking multi-phase generation with mixed analog/digital calibration loops in 28nm FDSOI CMOS
An injection-locked ring oscillator (ILRO) leveraging mixed analog/digital calibration loops for high-accuracy 8-phase clock generation is proposed. A phase detector (PD) based on passive mixers measures the quadrature error and continuously tunes the oscillator for fine phase correction. Concurrently, a window comparator monitors the PD output and drives digital coarse calibration in background. The ILRO maintains high phase accuracy over a wide operation frequency range and large supply and temperature variations. The chip is fabricated in 28nm FDSOI CMOS and with power consumption from 3mW to 15mW, measurements demonstrate a 0.2-11.7GHz frequency range with better than 1.5° quadrature phase error over ±20% supply and -40×120°C temperature variations. Measured performances meet the requirements of 1-to-45Gb/s quarter-rate multi-standard I/O receivers.
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