{"title":"数字测试生成与可测试性设计","authors":"J. Grason, Andrew W. Nagle","doi":"10.1145/800139.804527","DOIUrl":null,"url":null,"abstract":"This paper is a tutorial intended primarily for individuals just getting started in digital testing. Basic concepts of testing are described, and the steps in the test development process are discussed. A pragmatic approach to test sequence generation is presented, oriented towards ICs interconnected on a board. Finally, design for testability techniques are described, with an emphasis on solving problems that appeared during the test generation discussion.","PeriodicalId":196513,"journal":{"name":"17th Design Automation Conference","volume":"95 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1980-06-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"19","resultStr":"{\"title\":\"Digital Test Generation and Design for Testability\",\"authors\":\"J. Grason, Andrew W. Nagle\",\"doi\":\"10.1145/800139.804527\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper is a tutorial intended primarily for individuals just getting started in digital testing. Basic concepts of testing are described, and the steps in the test development process are discussed. A pragmatic approach to test sequence generation is presented, oriented towards ICs interconnected on a board. Finally, design for testability techniques are described, with an emphasis on solving problems that appeared during the test generation discussion.\",\"PeriodicalId\":196513,\"journal\":{\"name\":\"17th Design Automation Conference\",\"volume\":\"95 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1980-06-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"19\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"17th Design Automation Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/800139.804527\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"17th Design Automation Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/800139.804527","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Digital Test Generation and Design for Testability
This paper is a tutorial intended primarily for individuals just getting started in digital testing. Basic concepts of testing are described, and the steps in the test development process are discussed. A pragmatic approach to test sequence generation is presented, oriented towards ICs interconnected on a board. Finally, design for testability techniques are described, with an emphasis on solving problems that appeared during the test generation discussion.
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