具有闭环检测的双轴微陀螺仪

Seungdo An, Young-Se Oh, B. L. Lee, Kwang-Il Park, S. J. Kang, S. O. Choi, Y. Go, Cimoo Song
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引用次数: 69

摘要

采用表面微加工工艺制备了双轴微陀螺仪。振动结构采用LPCVD沉积的7.0 /spl mu/m厚多晶硅层。本文报道了基于四板旋转振动的微陀螺仪的闭环速率检测。特别是,该结构利用简单的力平衡扭转扭矩,不需要另一个顶部电极层,以减少电容型传感器的固有非线性。采用混合信号调理集成电路在高真空室中对陀螺仪进行了高q因子测试。实验得到0.1度/秒的噪声等效信号。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Dual-axis microgyroscope with closed-loop detection
A dual-axis microgyroscope is fabricated by a surface micromachining process. A 7.0 /spl mu/m-thick polysilicon layer deposited by LPCVD is used for the vibrating structure. We report the closed-loop rate detection of a microgyroscope based on the rotational vibration of the four plates. In particular, the structure utilizes a simple force-balancing torsional torque which does not need another top electrode layer to reduce the intrinsic nonlinearity of a capacitance-type sensor. The gyroscope is tested in a high vacuum chamber for a high Q-factor with hybrid signal-conditioning integrated circuit. The experiment resulted in a noise equivalent signal of 0.1 deg/sec.
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