{"title":"用体偏补偿动态逻辑中的模内变化","authors":"N. Azizi, Farid N. Najm","doi":"10.1109/NEWCAS.2005.1496753","DOIUrl":null,"url":null,"abstract":"We propose a fine-grained scheme to compensate for within-die variations in dynamic logic to reduce the variation in leakage, delay and noise margin through body-biasing. We first show that the amount of body-bias compensation needed depends on the correlation that exists between gates, and then analytically show the possible reduction in the variance of the leakage of both a single and multiple dynamic logic gates. We then design a circuit to implement the system which provides the reduction in the variance of the leakage, delay and noise margin of dynamic logic gates and show that it produces a close match to the analytical results. In our design, the variance of a typical test circuit is reduced by 27% and the variance of the path delay is reduced by 33%.","PeriodicalId":131387,"journal":{"name":"The 3rd International IEEE-NEWCAS Conference, 2005.","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-06-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"17","resultStr":"{\"title\":\"Compensation for within-die variations in dynamic logic by using body-bias\",\"authors\":\"N. Azizi, Farid N. Najm\",\"doi\":\"10.1109/NEWCAS.2005.1496753\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We propose a fine-grained scheme to compensate for within-die variations in dynamic logic to reduce the variation in leakage, delay and noise margin through body-biasing. We first show that the amount of body-bias compensation needed depends on the correlation that exists between gates, and then analytically show the possible reduction in the variance of the leakage of both a single and multiple dynamic logic gates. We then design a circuit to implement the system which provides the reduction in the variance of the leakage, delay and noise margin of dynamic logic gates and show that it produces a close match to the analytical results. In our design, the variance of a typical test circuit is reduced by 27% and the variance of the path delay is reduced by 33%.\",\"PeriodicalId\":131387,\"journal\":{\"name\":\"The 3rd International IEEE-NEWCAS Conference, 2005.\",\"volume\":\"6 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-06-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"17\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"The 3rd International IEEE-NEWCAS Conference, 2005.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NEWCAS.2005.1496753\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"The 3rd International IEEE-NEWCAS Conference, 2005.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NEWCAS.2005.1496753","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Compensation for within-die variations in dynamic logic by using body-bias
We propose a fine-grained scheme to compensate for within-die variations in dynamic logic to reduce the variation in leakage, delay and noise margin through body-biasing. We first show that the amount of body-bias compensation needed depends on the correlation that exists between gates, and then analytically show the possible reduction in the variance of the leakage of both a single and multiple dynamic logic gates. We then design a circuit to implement the system which provides the reduction in the variance of the leakage, delay and noise margin of dynamic logic gates and show that it produces a close match to the analytical results. In our design, the variance of a typical test circuit is reduced by 27% and the variance of the path delay is reduced by 33%.