{"title":"碳化硅微粉的场发射特性","authors":"T. Yoshimoto, N. Yokogawa, T. Iwata","doi":"10.1109/IVNC.2005.1619579","DOIUrl":null,"url":null,"abstract":"The field emission characteristics from the SiC micro powders with sharp edge are investigated. The edge of the SiC powder works as the field emitter. The emission current follows the Fowler-Nordheim relationship. An excellent emission stability in short term is confirmed. These results show that the SiC powder is a good candidate for field electron source.","PeriodicalId":121164,"journal":{"name":"2005 International Vacuum Nanoelectronics Conference","volume":"127 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Field emission characteristics form SiC micro powders\",\"authors\":\"T. Yoshimoto, N. Yokogawa, T. Iwata\",\"doi\":\"10.1109/IVNC.2005.1619579\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The field emission characteristics from the SiC micro powders with sharp edge are investigated. The edge of the SiC powder works as the field emitter. The emission current follows the Fowler-Nordheim relationship. An excellent emission stability in short term is confirmed. These results show that the SiC powder is a good candidate for field electron source.\",\"PeriodicalId\":121164,\"journal\":{\"name\":\"2005 International Vacuum Nanoelectronics Conference\",\"volume\":\"127 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-07-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2005 International Vacuum Nanoelectronics Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IVNC.2005.1619579\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2005 International Vacuum Nanoelectronics Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVNC.2005.1619579","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Field emission characteristics form SiC micro powders
The field emission characteristics from the SiC micro powders with sharp edge are investigated. The edge of the SiC powder works as the field emitter. The emission current follows the Fowler-Nordheim relationship. An excellent emission stability in short term is confirmed. These results show that the SiC powder is a good candidate for field electron source.
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