K. Murano, N. Takata, Misaki Hoshino, Y. Kami, F. Xiao, M. Tayarani
{"title":"用电路概念方法对BCI测试系统进行理论分析","authors":"K. Murano, N. Takata, Misaki Hoshino, Y. Kami, F. Xiao, M. Tayarani","doi":"10.1109/ISEMC.2016.7571716","DOIUrl":null,"url":null,"abstract":"In a bulk current injection test (BCI test), an electric current is injected into a wire harness connected to an electronic equipment. Since this test setup can be considered as a transmission line exposed to an external electromagnetic field, the relation of the line voltage and current is expressed by a modified telegrapher's equation. This paper reveals an analytical method of the BCI-test system using the circuit concept approach, and its effectiveness is experimentally verif ed. Furthermore, the difference between the susceptibility of transmission line exposed to the plane-EM field and that under the BCI test is shown as an example.","PeriodicalId":326016,"journal":{"name":"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"43 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Theoretical analysis of BCI test system using circuit concept approach\",\"authors\":\"K. Murano, N. Takata, Misaki Hoshino, Y. Kami, F. Xiao, M. Tayarani\",\"doi\":\"10.1109/ISEMC.2016.7571716\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In a bulk current injection test (BCI test), an electric current is injected into a wire harness connected to an electronic equipment. Since this test setup can be considered as a transmission line exposed to an external electromagnetic field, the relation of the line voltage and current is expressed by a modified telegrapher's equation. This paper reveals an analytical method of the BCI-test system using the circuit concept approach, and its effectiveness is experimentally verif ed. Furthermore, the difference between the susceptibility of transmission line exposed to the plane-EM field and that under the BCI test is shown as an example.\",\"PeriodicalId\":326016,\"journal\":{\"name\":\"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)\",\"volume\":\"43 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-07-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.2016.7571716\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.2016.7571716","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Theoretical analysis of BCI test system using circuit concept approach
In a bulk current injection test (BCI test), an electric current is injected into a wire harness connected to an electronic equipment. Since this test setup can be considered as a transmission line exposed to an external electromagnetic field, the relation of the line voltage and current is expressed by a modified telegrapher's equation. This paper reveals an analytical method of the BCI-test system using the circuit concept approach, and its effectiveness is experimentally verif ed. Furthermore, the difference between the susceptibility of transmission line exposed to the plane-EM field and that under the BCI test is shown as an example.