用Volterra级数分析评价双音信号输入下差频失真

Keiichi Tamesue, T. Egawa, A. Wakejima
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引用次数: 0

摘要

作为评价差频失真对互调失真和记忆效应影响的第一步,我们推导了差频和三阶互调时的失真特性。在频域Volterra核的实际计算中,我们使用了AlGaN/GaN HEMT的基频(约2 GHz)和差频(低至3 MHz)测量的I-V特性和s参数。我们得到了三阶volterra核(H3)的振幅作为频率的函数|Δf|。此外,我们的模拟预测了在没有谐波和差频转换效应的情况下,晶体管在基频附近的频率依赖性如何影响互调失真的不平衡。对于差分频率的H2,尽管H2的相位几乎是恒定的,但其幅度从3 MHz增加到40 MHz,这可能是由于GaN HEMT的电流崩溃造成的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Distortion in Difference Frequency under Two-Tone Signal Input Evaluated with Volterra Series Analysis
For the first step of evaluation of the effect of difference frequency distortion in intermodulation distortion and memory effects, we have derived distortion characteristics at the difference frequency as well as third-order intermodulation. In practical calculation of Volterra kernel in frequency domain, we used measured I-V characteristics, and S-parameters in both fundamental (around 2 GHz) and difference frequencies (down to 3 MHz) of an AlGaN/GaN HEMT. We obtained waving in magnitude of third order-Volterra kernel (H3) as a function of frequency |Δf|. Furthermore, our simulation predicted how frequency dependence of the transistor around the fundamental frequency affects unbalance of intermodulation distortion under no conversion effect from harmonics and difference frequencies. In terms of H2 for difference frequency, the magnitude was decreasing by increasing in frequency from 3 MHz to 40 MHz even though the phase of H2 was almost constant which may results from current collapse of the GaN HEMT.
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