基于tmr的DMA控制器中感知布图的故障注入的比较分析

2019 IEEE 31st International Conference on Microelectronics (MIEL) Pub Date : 2019-09-01 DOI:10.1109/MIEL.2019.8889643

P. Chernyakov, A. Skorobogatov, A. Zvyagin, E. Emin, I. Danilov, A. Balbekov, A. S. Khazanova, M. Gorbunov

{"title":"基于tmr的DMA控制器中感知布图的故障注入的比较分析","authors":"P. Chernyakov, A. Skorobogatov, A. Zvyagin, E. Emin, I. Danilov, A. Balbekov, A. S. Khazanova, M. Gorbunov","doi":"10.1109/MIEL.2019.8889643","DOIUrl":null,"url":null,"abstract":"We present a comparative analysis of the layout-aware fault injection simulation results for Direct Memory Access (DMA) controllers with local, distributed, global and block Triple Modular Redundancy (TMR). The applied technique is also presented.","PeriodicalId":391606,"journal":{"name":"2019 IEEE 31st International Conference on Microelectronics (MIEL)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Comparative Analysis of Layout-Aware Fault Injection on TMR-based DMA Controllers\",\"authors\":\"P. Chernyakov, A. Skorobogatov, A. Zvyagin, E. Emin, I. Danilov, A. Balbekov, A. S. Khazanova, M. Gorbunov\",\"doi\":\"10.1109/MIEL.2019.8889643\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We present a comparative analysis of the layout-aware fault injection simulation results for Direct Memory Access (DMA) controllers with local, distributed, global and block Triple Modular Redundancy (TMR). The applied technique is also presented.\",\"PeriodicalId\":391606,\"journal\":{\"name\":\"2019 IEEE 31st International Conference on Microelectronics (MIEL)\",\"volume\":\"41 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 IEEE 31st International Conference on Microelectronics (MIEL)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MIEL.2019.8889643\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE 31st International Conference on Microelectronics (MIEL)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MIEL.2019.8889643","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

对具有本地、分布式、全局和块三模冗余(TMR)的直接存储器存取(DMA)控制器的布局感知故障注入仿真结果进行了比较分析。并介绍了应用技术。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Comparative Analysis of Layout-Aware Fault Injection on TMR-based DMA Controllers

We present a comparative analysis of the layout-aware fault injection simulation results for Direct Memory Access (DMA) controllers with local, distributed, global and block Triple Modular Redundancy (TMR). The applied technique is also presented.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2019 IEEE 31st International Conference on Microelectronics (MIEL)

自引率

0.00%

发文量