{"title":"混沌半导体激光二极管分析","authors":"J. Toomey, D. Kane","doi":"10.1109/COMMAD.2006.4429906","DOIUrl":null,"url":null,"abstract":"Developments in measurement equipment bandwidth and memory have allowed standard chaotic time series analysis of the multi-GHz output power fluctuations of a semiconductor laser operating chaotically. An investigation into the effect of noise shows the degradation of this analysis at low signal-to-noise ratios.","PeriodicalId":347755,"journal":{"name":"2006 Conference on Optoelectronic and Microelectronic Materials and Devices","volume":"49 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Analysis of Chaotic Semiconductor Laser Diodes\",\"authors\":\"J. Toomey, D. Kane\",\"doi\":\"10.1109/COMMAD.2006.4429906\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Developments in measurement equipment bandwidth and memory have allowed standard chaotic time series analysis of the multi-GHz output power fluctuations of a semiconductor laser operating chaotically. An investigation into the effect of noise shows the degradation of this analysis at low signal-to-noise ratios.\",\"PeriodicalId\":347755,\"journal\":{\"name\":\"2006 Conference on Optoelectronic and Microelectronic Materials and Devices\",\"volume\":\"49 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2006 Conference on Optoelectronic and Microelectronic Materials and Devices\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/COMMAD.2006.4429906\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 Conference on Optoelectronic and Microelectronic Materials and Devices","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/COMMAD.2006.4429906","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Developments in measurement equipment bandwidth and memory have allowed standard chaotic time series analysis of the multi-GHz output power fluctuations of a semiconductor laser operating chaotically. An investigation into the effect of noise shows the degradation of this analysis at low signal-to-noise ratios.
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