{"title":"商用多线路TRL校准","authors":"L. Hayden","doi":"10.1109/ARFTG.2007.8376226","DOIUrl":null,"url":null,"abstract":"A commercial implementation of the reference multi-line TRL has recently become available [1]. While the algorithm implementation has intentionally been kept as true to the previously published details [2]–[3] as possible, the implementation in a current and supported software application enables new capabilities. In addition to support for reference line Zo and propagation constant determination, Zo renormalization, and error term error bound comparison [4], the new implementation supports a wide-variety of vector network analyzer models. Fully automated MLTRL calibration is enabled by using programmable stage and positioner moves with appropriately equipped semi-automatic probe stations. The automation and improved consistency of probe placement results in dramatically faster and less laborious calibration with better calibration repeatability.","PeriodicalId":199632,"journal":{"name":"2007 70th ARFTG Microwave Measurement Conference (ARFTG)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"A commercial multi-line TRL calibration\",\"authors\":\"L. Hayden\",\"doi\":\"10.1109/ARFTG.2007.8376226\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A commercial implementation of the reference multi-line TRL has recently become available [1]. While the algorithm implementation has intentionally been kept as true to the previously published details [2]–[3] as possible, the implementation in a current and supported software application enables new capabilities. In addition to support for reference line Zo and propagation constant determination, Zo renormalization, and error term error bound comparison [4], the new implementation supports a wide-variety of vector network analyzer models. Fully automated MLTRL calibration is enabled by using programmable stage and positioner moves with appropriately equipped semi-automatic probe stations. The automation and improved consistency of probe placement results in dramatically faster and less laborious calibration with better calibration repeatability.\",\"PeriodicalId\":199632,\"journal\":{\"name\":\"2007 70th ARFTG Microwave Measurement Conference (ARFTG)\",\"volume\":\"23 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 70th ARFTG Microwave Measurement Conference (ARFTG)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.2007.8376226\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 70th ARFTG Microwave Measurement Conference (ARFTG)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.2007.8376226","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A commercial implementation of the reference multi-line TRL has recently become available [1]. While the algorithm implementation has intentionally been kept as true to the previously published details [2]–[3] as possible, the implementation in a current and supported software application enables new capabilities. In addition to support for reference line Zo and propagation constant determination, Zo renormalization, and error term error bound comparison [4], the new implementation supports a wide-variety of vector network analyzer models. Fully automated MLTRL calibration is enabled by using programmable stage and positioner moves with appropriately equipped semi-automatic probe stations. The automation and improved consistency of probe placement results in dramatically faster and less laborious calibration with better calibration repeatability.