{"title":"用于生成自测试宏的编译器设计","authors":"R.P. van Riessen, H. Kerkhoff, A. Kloppenburg","doi":"10.1109/ESSCIRC.1988.5468351","DOIUrl":null,"url":null,"abstract":"This paper describes the design and implementation of a macro-dependent self-test compiler. The compiler requires information from the designer about the type and size of the macro that has to be generated. Dependent on the desired faultcoverage, the compiler automatically generates the layout of the macro, including the appropriate data-generation and evaluation self-test hardware. A scan path, based on the boundary-scan principle, is used to initialize the self-test hardware.","PeriodicalId":197244,"journal":{"name":"ESSCIRC '88: Fourteenth European Solid-State Circuits Conference","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Design of a Compiler for the Generation of Self-Testable Macros\",\"authors\":\"R.P. van Riessen, H. Kerkhoff, A. Kloppenburg\",\"doi\":\"10.1109/ESSCIRC.1988.5468351\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes the design and implementation of a macro-dependent self-test compiler. The compiler requires information from the designer about the type and size of the macro that has to be generated. Dependent on the desired faultcoverage, the compiler automatically generates the layout of the macro, including the appropriate data-generation and evaluation self-test hardware. A scan path, based on the boundary-scan principle, is used to initialize the self-test hardware.\",\"PeriodicalId\":197244,\"journal\":{\"name\":\"ESSCIRC '88: Fourteenth European Solid-State Circuits Conference\",\"volume\":\"4 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1988-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ESSCIRC '88: Fourteenth European Solid-State Circuits Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ESSCIRC.1988.5468351\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ESSCIRC '88: Fourteenth European Solid-State Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESSCIRC.1988.5468351","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Design of a Compiler for the Generation of Self-Testable Macros
This paper describes the design and implementation of a macro-dependent self-test compiler. The compiler requires information from the designer about the type and size of the macro that has to be generated. Dependent on the desired faultcoverage, the compiler automatically generates the layout of the macro, including the appropriate data-generation and evaluation self-test hardware. A scan path, based on the boundary-scan principle, is used to initialize the self-test hardware.