AIM-Lab:通过互联网远程表征电子设备和电路的系统

Proceedings of the 2000 Third IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.00TH8474) Pub Date : 2000-03-15 DOI:10.1109/ICCDCS.2000.869858

T.A. Fieldly, M. Shur, H. Shen, T. Ytterdal

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引用次数: 22

摘要

我们报告了AIM-Lab的发展，这是一个远程操作的实验室，用于表征互联网上的电子设备和电路。具体来说，我们将AIM-Lab概念应用于高级/研究生半导体器件和电路中，该器件附带一个实验室模块，其中包括在CMOS芯片和SiC二极管上进行的多达9个实验。AIM-Lab已在伦斯勒理工学院和挪威科技大学的远程学习项目中使用。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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AIM-Lab: a system for remote characterization of electronic devices and circuits over the Internet

We report on the development of AIM-Lab, a remotely operated laboratory for characterization of electronic devices and circuits over the Internet. Specifically, we apply the AIM-Lab concept in a senior/graduate semiconductor devices and circuits, which comes with a laboratory module that includes up to 9 experiments performed on a CMOS chip and a SiC diode. AIM-Lab has been used in the distance learning programs at Rensselaer Polytechnic Institute and at the Norwegian University of Science and Technology.

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Proceedings of the 2000 Third IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.00TH8474)

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