v0.95 w0.05 ox基非冷却微热计的增强特性

S. Moon, Y. Han, Kuntae Kim, Seunghun Lee, H. Shin
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引用次数: 3

摘要

本文以氧化钒钨为红外敏感材料,制备了高性能非制冷微热计,并对其热特性进行了表征。与VOx薄膜相比,优化后的V0.95W0.05Ox薄膜具有- 3.0%/K以上的高TCR值和低噪声特性。制备的v0.95 w0.05 ox基微辐射热计采用真空封装,并配有热电冷却器,用于测量辐射热学性能。在室温电阻为71 kOmega时,器件的TCR值为-3.49%/K,测得的热导率为6.1 × 10-7 W/K。最后,在斩波频率为10 Hz、偏置电流为7.4 muA的条件下,我们获得了1.8倍104 W/K以上的高响应度和1.3倍109 cmHzfrac12/W以上的高探测度
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Enhanced Characteristics of V0.95W0.05OX-Based Uncooled Microbolometer
In this work, high-performance uncooled microbolometer was fabricated by using vanadium tungsten oxide as a infrared-sensitive material and its bolometric properties was characterized. As a bolometric material, the optimized V0.95W0.05Ox thin film has a high TCR value over - 3.0%/K and low noise properties compared with VOx thin film. The fabricated V0.95W0.05Ox-based microbolometer was vacuum-packaged and equipped with thermal electric cooler for the measurement of bolometric properties. The TCR value of the fabricated device was -3.49%/K at room temperature resistance of 71 kOmega and the measured thermal conductance was 6.1times10-7 W/K. Finally, we obtained high responsivity over 1.8times104 W/K and high detectivity over 1.3times109 cmHzfrac12/W at a chopper frequency of 10 Hz and a bias current of 7.4 muA
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