{"title":"15b线性,20MS/s, 1.5b/级流水线ADC数字校准与信号相关的抖动","authors":"Yun-Shiang Shu, B. Song","doi":"10.1109/VLSIC.2006.1705388","DOIUrl":null,"url":null,"abstract":"A signal-dependent dithering concept is developed to measure the multiplying DAC (MDAC) gain error of a 1.5b/stage pipelined ADC in background. A 15b, 20MS/s prototype ADC exhibits SFDR and THD of 98 and -92dB with 14.5MHz input. The chip fabricated in 0.18mum CMOS occupies 2.3 times 1.7mm2, and consumes 285mW at 1.8V","PeriodicalId":366835,"journal":{"name":"2006 Symposium on VLSI Circuits, 2006. Digest of Technical Papers.","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-06-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"18","resultStr":"{\"title\":\"A 15b-Linear, 20MS/s, 1.5b/Stage Pipelined ADC Digitally Calibrated with Signal-Dependent Dithering\",\"authors\":\"Yun-Shiang Shu, B. Song\",\"doi\":\"10.1109/VLSIC.2006.1705388\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A signal-dependent dithering concept is developed to measure the multiplying DAC (MDAC) gain error of a 1.5b/stage pipelined ADC in background. A 15b, 20MS/s prototype ADC exhibits SFDR and THD of 98 and -92dB with 14.5MHz input. The chip fabricated in 0.18mum CMOS occupies 2.3 times 1.7mm2, and consumes 285mW at 1.8V\",\"PeriodicalId\":366835,\"journal\":{\"name\":\"2006 Symposium on VLSI Circuits, 2006. Digest of Technical Papers.\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-06-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"18\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2006 Symposium on VLSI Circuits, 2006. Digest of Technical Papers.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VLSIC.2006.1705388\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 Symposium on VLSI Circuits, 2006. Digest of Technical Papers.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSIC.2006.1705388","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 18
摘要
提出了一种信号相关的抖动概念,用于测量1.5b/级流水线ADC在后台的倍增DAC (MDAC)增益误差。一个15b, 20MS/s的原型ADC在14.5MHz输入时的SFDR和THD分别为98和-92dB。该芯片采用0.18 μ m CMOS工艺,占地2.3 × 1.7mm2,功耗285mW,电压为1.8V
A 15b-Linear, 20MS/s, 1.5b/Stage Pipelined ADC Digitally Calibrated with Signal-Dependent Dithering
A signal-dependent dithering concept is developed to measure the multiplying DAC (MDAC) gain error of a 1.5b/stage pipelined ADC in background. A 15b, 20MS/s prototype ADC exhibits SFDR and THD of 98 and -92dB with 14.5MHz input. The chip fabricated in 0.18mum CMOS occupies 2.3 times 1.7mm2, and consumes 285mW at 1.8V