一种验证DFx IJTAG网络的非icl UVM方法及其优缺点与ICL-PDL方法比较

Ronak Dham, Harish Gumudavelli
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摘要

另一种基于XML的ICL-PDL方法,使用UVM测试台在IJTAG网络中验证DFx控制器,即从块扩展到全芯片。本文概述了标准ICL-PDL方法所面临的挑战,以及基于XML的方法如何利用基于SV UVM的测试平台的优势来帮助克服这些挑战。在验证DFx IJTAG网络时,它比较了两者之间的相似之处,并描述了使用非icl方法而不是ICL-PDL的额外优点。我们的主要想法是重用UVM测试台架进行DFx控制器验证。这种方法有助于快速调试,提取代码覆盖率,并为功能和DFT组件开发一个通用的验证平台。这个基础结构帮助我们进行芯片级的修复和验证,而典型的基于ICL-PDL的方法需要更长的故障调试迭代。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A non-ICL UVM approach to verifying DFx IJTAG network and its pros and cons v/s the ICL-PDL approach
An alternate XML based approach to ICL-PDL, to verifying DFx controller in an IJTAG network using UVM testbench i.e. scalable from block to full-chip. Current paper presents an overview of challenges with the standard ICL-PDL approach and how an XML based approaching leveraging the perks of using SV UVM based testbench can help overcome them. It draws parallels between the two and delineates the added advantages of using non-ICL approach as opposed to ICL-PDL when it comes to verifying DFx IJTAG network. Our main idea was to reuse UVM testbench for DFx controller verification. This approach helped in quick debugs, extracting code coverage and developing a common verification platform for functional and DFT components. This infrastructure helped us in chip level repair and verification whereas typical ICL-PDL based approach takes longer iterations for failure debug.
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