J.A. Bastos, J.A. Kussler, L.J. Cassol, M. Lubaszewski
{"title":"开关电路的在线测试","authors":"J.A. Bastos, J.A. Kussler, L.J. Cassol, M. Lubaszewski","doi":"10.1109/SBCCI.1999.803114","DOIUrl":null,"url":null,"abstract":"This paper presents the use of partial duplication to on-line test a switching circuit used in a communication system. The test methodology is validated by fault simulation. The final system is fault tolerant because a test cell may replace a faulty cell, whenever diagnosis can be successfully carried out. A prototype of the on-line testable switching circuit has been produced.","PeriodicalId":342390,"journal":{"name":"Proceedings. XII Symposium on Integrated Circuits and Systems Design (Cat. No.PR00387)","volume":"44 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-09-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"On-line test of a switching circuit\",\"authors\":\"J.A. Bastos, J.A. Kussler, L.J. Cassol, M. Lubaszewski\",\"doi\":\"10.1109/SBCCI.1999.803114\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents the use of partial duplication to on-line test a switching circuit used in a communication system. The test methodology is validated by fault simulation. The final system is fault tolerant because a test cell may replace a faulty cell, whenever diagnosis can be successfully carried out. A prototype of the on-line testable switching circuit has been produced.\",\"PeriodicalId\":342390,\"journal\":{\"name\":\"Proceedings. XII Symposium on Integrated Circuits and Systems Design (Cat. No.PR00387)\",\"volume\":\"44 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-09-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings. XII Symposium on Integrated Circuits and Systems Design (Cat. No.PR00387)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SBCCI.1999.803114\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. XII Symposium on Integrated Circuits and Systems Design (Cat. No.PR00387)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SBCCI.1999.803114","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This paper presents the use of partial duplication to on-line test a switching circuit used in a communication system. The test methodology is validated by fault simulation. The final system is fault tolerant because a test cell may replace a faulty cell, whenever diagnosis can be successfully carried out. A prototype of the on-line testable switching circuit has been produced.