Sangheon Kwon, Kyungmin Lee, Yoonsoo Kim, Kyungah Kim, Changmin Lee, W. Ro
{"title":"基于硬件加速神经网络的SRAM结构容错性测量","authors":"Sangheon Kwon, Kyungmin Lee, Yoonsoo Kim, Kyungah Kim, Changmin Lee, W. Ro","doi":"10.1109/ICCE-ASIA.2016.7804818","DOIUrl":null,"url":null,"abstract":"Hardware accelerators for convolutional neural network (CNN) accompany a large amount of SRAM in order to reduce the number of expensive off-chip DRAM accesses. This design trend gives implications to architects: the SRAM area will dominate the entire chip area for the future CNN accelerators. Since the probability of soft errors such as energetic particle strikes goes as the density of SRAM, errors on memory sub-system will become a major concern as process technology scales. In this paper, we investigate the necessity of a fault-tolerant memory system, against such soft errors, in hardware accelerated neural network. We found that convolutional layers have different error tolerance from each other. The error tolerance of a layer tends to get worse as it goes on the output layer.","PeriodicalId":229557,"journal":{"name":"2016 IEEE International Conference on Consumer Electronics-Asia (ICCE-Asia)","volume":"68 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"Measuring error-tolerance in SRAM architecture on hardware accelerated neural network\",\"authors\":\"Sangheon Kwon, Kyungmin Lee, Yoonsoo Kim, Kyungah Kim, Changmin Lee, W. Ro\",\"doi\":\"10.1109/ICCE-ASIA.2016.7804818\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Hardware accelerators for convolutional neural network (CNN) accompany a large amount of SRAM in order to reduce the number of expensive off-chip DRAM accesses. This design trend gives implications to architects: the SRAM area will dominate the entire chip area for the future CNN accelerators. Since the probability of soft errors such as energetic particle strikes goes as the density of SRAM, errors on memory sub-system will become a major concern as process technology scales. In this paper, we investigate the necessity of a fault-tolerant memory system, against such soft errors, in hardware accelerated neural network. We found that convolutional layers have different error tolerance from each other. The error tolerance of a layer tends to get worse as it goes on the output layer.\",\"PeriodicalId\":229557,\"journal\":{\"name\":\"2016 IEEE International Conference on Consumer Electronics-Asia (ICCE-Asia)\",\"volume\":\"68 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE International Conference on Consumer Electronics-Asia (ICCE-Asia)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICCE-ASIA.2016.7804818\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE International Conference on Consumer Electronics-Asia (ICCE-Asia)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCE-ASIA.2016.7804818","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Measuring error-tolerance in SRAM architecture on hardware accelerated neural network
Hardware accelerators for convolutional neural network (CNN) accompany a large amount of SRAM in order to reduce the number of expensive off-chip DRAM accesses. This design trend gives implications to architects: the SRAM area will dominate the entire chip area for the future CNN accelerators. Since the probability of soft errors such as energetic particle strikes goes as the density of SRAM, errors on memory sub-system will become a major concern as process technology scales. In this paper, we investigate the necessity of a fault-tolerant memory system, against such soft errors, in hardware accelerated neural network. We found that convolutional layers have different error tolerance from each other. The error tolerance of a layer tends to get worse as it goes on the output layer.