M. Aharoni, Sigal Asaf, L. Fournier, A. Koyfman, Raviv Nagel
{"title":"用于数据路径浮点验证的测试生成框架","authors":"M. Aharoni, Sigal Asaf, L. Fournier, A. Koyfman, Raviv Nagel","doi":"10.1109/HLDVT.2003.1252469","DOIUrl":null,"url":null,"abstract":"FPgen is a new test generation framework targeted toward the verification of the floating point (FP) datapath, through the generation of test cases. This framework provides the capacity to define virtually any architectural FP coverage model, consisting of verification tasks. The tool supplies strong constraint solving capabilities, allowing the generation of random tests that target these tasks. We present an overview of FPgen's functionality, describe the results of its use for the verification of several FP units, and compare its efficiency with existing test generators.","PeriodicalId":344813,"journal":{"name":"Eighth IEEE International High-Level Design Validation and Test Workshop","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"47","resultStr":"{\"title\":\"FPgen - a test generation framework for datapath floating-point verification\",\"authors\":\"M. Aharoni, Sigal Asaf, L. Fournier, A. Koyfman, Raviv Nagel\",\"doi\":\"10.1109/HLDVT.2003.1252469\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"FPgen is a new test generation framework targeted toward the verification of the floating point (FP) datapath, through the generation of test cases. This framework provides the capacity to define virtually any architectural FP coverage model, consisting of verification tasks. The tool supplies strong constraint solving capabilities, allowing the generation of random tests that target these tasks. We present an overview of FPgen's functionality, describe the results of its use for the verification of several FP units, and compare its efficiency with existing test generators.\",\"PeriodicalId\":344813,\"journal\":{\"name\":\"Eighth IEEE International High-Level Design Validation and Test Workshop\",\"volume\":\"12 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-11-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"47\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Eighth IEEE International High-Level Design Validation and Test Workshop\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/HLDVT.2003.1252469\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Eighth IEEE International High-Level Design Validation and Test Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HLDVT.2003.1252469","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
FPgen - a test generation framework for datapath floating-point verification
FPgen is a new test generation framework targeted toward the verification of the floating point (FP) datapath, through the generation of test cases. This framework provides the capacity to define virtually any architectural FP coverage model, consisting of verification tasks. The tool supplies strong constraint solving capabilities, allowing the generation of random tests that target these tasks. We present an overview of FPgen's functionality, describe the results of its use for the verification of several FP units, and compare its efficiency with existing test generators.