用微波轴向层析成像原型机成像含金属夹杂的介质目标

A. Salvadè, R. Monleone, A. Massimini, S. Poretti, M. Maffongelli, M. Pastorino, A. Randazzo
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引用次数: 0

摘要

微波系统正在成为成像应用的强大工具。事实上,当设计时考虑到充分的散射现象时,它们能够直接提供有关被测目标的物理性质的信息。在本文中,通过使用微波轴向层析成像仪的原型来评估检测介电物体内部金属夹杂物的可能性,该原型能够创建被检测目标的介电介电常数和电导率的图像。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Imaging of dielectric targets with metallic inclusions by means of a prototype of microwave axial tomograph
Microwave systems are becoming powerful tools for imaging applications. In fact, when designed by taking into account the full scattering phenomena, they are able to directly provide information about the physical properties of the target under test. In this paper, the possibility of detecting metallic inclusions inside dielectric objects is assessed by using a prototype of a microwave axial tomograph, which is able to create images of the dielectric permittivity and of the electric conductivity of the inspected target.
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