{"title":"利用Arduino的力量提升故障分析实验室","authors":"Tim Watson","doi":"10.31399/asm.cp.istfa2022tpo1","DOIUrl":null,"url":null,"abstract":"\n This presentation provides an overview of the Arduino microcontroller development board, its features and capabilities, and its integrated design environment. It also provides examples of its use in soft defect localization (SDL) and laser assisted device alteration (LADA).","PeriodicalId":417175,"journal":{"name":"International Symposium for Testing and Failure Analysis","volume":"128 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-10-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Leveraging the Power of Arduino to Elevate the Failure Analysis Lab\",\"authors\":\"Tim Watson\",\"doi\":\"10.31399/asm.cp.istfa2022tpo1\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\\n This presentation provides an overview of the Arduino microcontroller development board, its features and capabilities, and its integrated design environment. It also provides examples of its use in soft defect localization (SDL) and laser assisted device alteration (LADA).\",\"PeriodicalId\":417175,\"journal\":{\"name\":\"International Symposium for Testing and Failure Analysis\",\"volume\":\"128 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-10-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Symposium for Testing and Failure Analysis\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.31399/asm.cp.istfa2022tpo1\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Symposium for Testing and Failure Analysis","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.31399/asm.cp.istfa2022tpo1","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Leveraging the Power of Arduino to Elevate the Failure Analysis Lab
This presentation provides an overview of the Arduino microcontroller development board, its features and capabilities, and its integrated design environment. It also provides examples of its use in soft defect localization (SDL) and laser assisted device alteration (LADA).
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