片上I/O电源噪声测量及单点登录引起的噪声幅度与时延增加的相关性验证

2010 IEEE 14th Workshop on Signal Propagation on Interconnects Pub Date : 2010-05-09 DOI:10.1109/SPI.2010.5483591

Y. Takai, Y. Ogasahara, M. Hashimoto, T. Onoye

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引用次数: 0

摘要

本文介绍了用90nm工艺制作的简单测试结构对输入输出单元的电源环和地环上的片上噪声的测量结果。我们还展示了从芯片到PCB板的输出信号的测量时序，并检查了I/O电源噪声的大小与输出转换时序之间的关系。

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Measurement of on-chip I/O power supply noise and correlation verification between noise magnitude and delay increase due to SSO

This paper presents measurement results of on-chip noise on power and ground rings for I/O (input/output) cells in a simple test structure fabricated in 90nm process. We also show measured timings of an output signal from chip to PCB board, and examine the relation between the magnitude of I/O power supply noise and the output transition timings.

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2010 IEEE 14th Workshop on Signal Propagation on Interconnects

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