具有高ESD抗扰度的CMOS RF LNA

Siu-Keitang, C. Chan, C. Choy, K. Pun
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引用次数: 7

摘要

我们提出了一种具有高ESD抗扰度的两级LNA设计。我们使用一个共门放大器作为我们设计的输入级。射频输入直接连接到晶体管的源,这将提供比传统的共源放大器更高的ESD保护。该两级LNA采用AMS 0.35-/spl mu/m CMOS技术,工作频率为1.8 GHz,电压为1.5 V。新型LNA的测量功率增益为14.1 dB,噪声系数为5 dB。反向隔离为-32 dB,输出参考的三阶截距点为6.3 dBm。测得HBM ESD耐压分别为1.5kV和-3.5kV。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
CMOS RF LNA with high ESD immunity
We present a two-stage LNA design with a high ESD immunity. We use a common-gate amplifier as an input stage for our design. The RF input is directly connected to the source of the transistor, which will provide a higher ESD protection than conventional common-source amplifiers. The two-stage LNA is designed to operate at 1.8 GHz with a voltage supply of 1.5 V using AMS 0.35-/spl mu/m CMOS technology. The new LNA has a measured power gain of 14.1 dB with a noise figure of 5 dB. The reverse isolation is -32 dB, and the output-referred third-order intercept point is 6.3 dBm. The measured HBM ESD withstand voltages are 1.5kV and -3.5kV.
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