{"title":"具有高ESD抗扰度的CMOS RF LNA","authors":"Siu-Keitang, C. Chan, C. Choy, K. Pun","doi":"10.1109/APCCAS.2004.1412759","DOIUrl":null,"url":null,"abstract":"We present a two-stage LNA design with a high ESD immunity. We use a common-gate amplifier as an input stage for our design. The RF input is directly connected to the source of the transistor, which will provide a higher ESD protection than conventional common-source amplifiers. The two-stage LNA is designed to operate at 1.8 GHz with a voltage supply of 1.5 V using AMS 0.35-/spl mu/m CMOS technology. The new LNA has a measured power gain of 14.1 dB with a noise figure of 5 dB. The reverse isolation is -32 dB, and the output-referred third-order intercept point is 6.3 dBm. The measured HBM ESD withstand voltages are 1.5kV and -3.5kV.","PeriodicalId":426683,"journal":{"name":"The 2004 IEEE Asia-Pacific Conference on Circuits and Systems, 2004. Proceedings.","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-12-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"CMOS RF LNA with high ESD immunity\",\"authors\":\"Siu-Keitang, C. Chan, C. Choy, K. Pun\",\"doi\":\"10.1109/APCCAS.2004.1412759\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We present a two-stage LNA design with a high ESD immunity. We use a common-gate amplifier as an input stage for our design. The RF input is directly connected to the source of the transistor, which will provide a higher ESD protection than conventional common-source amplifiers. The two-stage LNA is designed to operate at 1.8 GHz with a voltage supply of 1.5 V using AMS 0.35-/spl mu/m CMOS technology. The new LNA has a measured power gain of 14.1 dB with a noise figure of 5 dB. The reverse isolation is -32 dB, and the output-referred third-order intercept point is 6.3 dBm. The measured HBM ESD withstand voltages are 1.5kV and -3.5kV.\",\"PeriodicalId\":426683,\"journal\":{\"name\":\"The 2004 IEEE Asia-Pacific Conference on Circuits and Systems, 2004. Proceedings.\",\"volume\":\"23 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-12-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"The 2004 IEEE Asia-Pacific Conference on Circuits and Systems, 2004. Proceedings.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/APCCAS.2004.1412759\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"The 2004 IEEE Asia-Pacific Conference on Circuits and Systems, 2004. Proceedings.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APCCAS.2004.1412759","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
We present a two-stage LNA design with a high ESD immunity. We use a common-gate amplifier as an input stage for our design. The RF input is directly connected to the source of the transistor, which will provide a higher ESD protection than conventional common-source amplifiers. The two-stage LNA is designed to operate at 1.8 GHz with a voltage supply of 1.5 V using AMS 0.35-/spl mu/m CMOS technology. The new LNA has a measured power gain of 14.1 dB with a noise figure of 5 dB. The reverse isolation is -32 dB, and the output-referred third-order intercept point is 6.3 dBm. The measured HBM ESD withstand voltages are 1.5kV and -3.5kV.