对LEON3处理器内存中SEU后果的深入分析

2016 17th Latin-American Test Symposium (LATS) Pub Date : 2016-04-06 DOI:10.1109/LATW.2016.7483358

Afef Kchaou, W. H. Youssef, R. Tourki, F. Bouesse, P. Ramos, R. Velazco

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引用次数: 3

摘要

本文分析了单事件干扰(SEU)对Aeroflex Gaisler LEON3处理器(基于SPARC V8架构的32位可合成处理器)内存的影响。为了在执行AES基准测试时对错误行为进行分类，研究并说明了一种允许错误注入的新软件方法。为了测试LEON3处理器的行为，进行了详尽的故障注入活动。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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A deep analysis of SEU consequences in the internal memory of LEON3 processor

This paper presents an analysis of the effects of Single Event Upset (SEU) into the internal memory of Aeroflex Gaisler LEON3 processor which is a 32-bit synthesizable processor based on SPARC V8 architecture implemented in an FPGA. A new software methodology allowing fault injection is explored and illustrated in order to classify the faulty behaviors while executing an AES benchmark. An exhaustive fault-injection campaign was performed to test the behavior of LEON3 processor.

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2016 17th Latin-American Test Symposium (LATS)

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