栅极偏置电路的SCCMOS功率开关实现最大的泄漏减少

A. Valentian, E. Beigné
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引用次数: 8

摘要

在待机状态下,功率开关晶体管能有效地切断数字电路的漏电流。此外,在现有的功率开关晶体管中,由于SCCMOS使用低vth晶体管,因此最适合低vdd环境。如果在其栅极上施加最佳电压以使泄漏增益最大化,则这种功率开关类型实现了良好的泄漏减少效果。根据操作条件(工艺、电压、温度),这个最佳电压值不能在设计层面确定。因此,我们设计并制造了一种极化电路,可以在任何环境条件下自动找到最佳偏置电压。该电路采用意法半导体(STMicroelectronics)的块体65nm技术实现,在功率开关级实现了20多年的泄漏电流降低,而在环境温度下的功耗开销为45 nW。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Gate bias circuit for an SCCMOS power switch achieving maximum leakage reduction
Power switch transistors are very effective in cutting leakage currents of digital circuits in standby mode. Moreover, among the existing power switch transistors, SCCMOS is the most suited to a low-VDD environment since it uses a Iow-VTH transistor. This power switch type achieves good leakage reduction results, provided that an optimal voltage is applied on its gate in order to maximize the leakage gain. This optimal voltage value, depending on the operating conditions (process, voltage, temperature), cannot be determined at the design level. We have therefore designed and fabricated a polarization circuit that automatically finds the optimal bias voltage whatever the environment conditions. This circuit, realized in STMicroelectronics bulk 65 nm technology, achieves more than two decades leakage current reduction at the power switch level, for a power dissipation overhead of 45 nW at ambient temperature.
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